大拱桥--暨南大学学生门户 » 图书馆 » 参数测试与检验(分类号：TN304.07)(共6本)

半导体材料测试与分析

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索取号：TN304.07/20101
作者：杨德仁、
出版社：北京 : 科学出版社, 2010

Lsi & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

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索取号：TN304.07-53/E801/1978
作者：Semiconductor Test Conference (1978 : Cherry Hill、 Township、 N.J.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社：New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1978.

半导体的检测与分析

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索取号：TN304.07/841.2
作者：许振嘉、
出版社：北京 : 科学出版社, 2007

Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J.

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索取号：TN304.07-53/E801/1977
作者：Symposium on Semiconductor Memory Testing (1977 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、IEEE Computer Society. Philadelphia Chapter.、
出版社：New York : Institute of Electrical and Electronics Engineers, c1977.

Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J.

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索取号：TN304.07-53/E801/1973
作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、
出版社：New York : IEEE, c1973.

半导体测试技术原理与应用

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索取号：TN304.07/20071
作者：刘新福、杜占平、李为民、
出版社：北京 : 冶金工业出版社, 2007
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