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Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号:TN06-53/E801/9
作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Statistical sampling : past, present, and future theoretical and practical

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索取号:
作者:Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、
出版社:Philadelphia, PA : ASTM, c1990.

Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico

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索取号:TN1-53/E805
作者:International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、
出版社:[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.

1975 IEEE MTT-S International Microwave Symposium : digest of technical papers

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索取号:TN019.2-7/E801/1975
作者:IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、
出版社:Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975

1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL

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索取号:TN019.2/E806/1972
作者:IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、
出版社:New York : Institute of Electrical and Electronics Engineers, 1972.

Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology

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索取号:TN304.1-53/E801/3
作者:International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、
出版社:Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.

Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973

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索取号:TN153-53/E802/31
作者:Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、
出版社:Baton Rouge : Claitor's Publishing Division, 1973.

Polarons in ionic crystals and polar semiconductors : Antwerp Advanced Study Institute 1971 on Fr?hlich polarons and electron-phonon interaction in polar semiconductors

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索取号:TN304.6/E801
作者:Antwerp Advanced Study Institute on Fr?hlich Polarons and Electron-Phonon Interaction in Polar Semiconductors (1971)、Devreese、 J. T. (Jozef T.)、
出版社:Amsterdam : North-Holland Publishing Company ; New York : American Elsevier Publishing Co., 1972.

Technical digest : 1977 International Electron Devices Meeting, December 5, 6 and 7, 1977, Washington, D.C.

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索取号:TN11-53/E801/1977
作者:International Electron Devices Meeting (23rd : 1977 : Washington、 D.C.)、IEEE Electron Devices Society.、
出版社:New York : Institute of Electrical and Electronics Engineers, 1977.

Boron: synthesis, structure, and properties : proceedings of the conference on Boron

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索取号:TN304.16-53/E701
作者:International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、 Institute for Exploratory Research (U.S.)、
出版社:New York : Plenum Press, 1960.

Organic and polymetric materials and devices--optical, electrical and optoelectronic properties : symposium held April 1-5, 2002, San Francisco, California, U.S.A.

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索取号:TN304.52/E20041
作者:
出版社:Pittsburgh, Pa. : Materials Research Society, c2002.

Peroxisome proliferator activated receptors : from basic science to clinical applications

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索取号:Q55-532/E20031
作者:International Symposium on PPARs: From Basic Science to Clinical Applications (1st: 2001 : Florence、 Italy)、Fruchart、 J. C. (Jean-Charles)、 1945-、
出版社:Dordrecht ; Boston : Kluwer Academic Pub. ; Milan, Italy : Fondazione Giovanni Lorenzini Medical Science Foundation ; Houston, Tex., U.S.A. : Giovanni Lorenzini Medical Foundation, c2002.

2002 IEEE/IFIP Network Operations and Management Symposium "Management Solutions for the New Communications World" : proceedings

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索取号:TN919.2-532/E20011/2
作者:IEEE/IFIP Network Operations and Management Symposium (8th : 2002 : Florence、 Italy)、Stadler、 Rolf.、Ulema、 Mehmet.、IEEE Communications Society.、International Federation for Information Processing.、
出版社:Piscataway, N.J. : IEEE, c2002.

Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems : August 8-11, 2000, Lansing Convention Center, Lansing, MI

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索取号:TN7-53/E20071/43.3
作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、
出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.

Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems : August 8-11, 2000, Lansing Convention Center, Lansing, MI

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索取号:TN7-53/E20071/43.2
作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、
出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.

Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems : August 8-11, 2000, Lansing Convention Center, Lansing, MI

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索取号:TN7-53/E20071/43.1
作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、
出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.
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