大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Institution of Electrical Engineers. Science 的图书(共3392本)

Readings in financial institution management : modern techniques for a global industry

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索取号:F811.2/E993
作者:
出版社:St Leonards, N.S.W. : Allen & Unwin, 1999.

Handbook of logic in computer science

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索取号:TP3/E9913
作者:
出版社:Oxford : Clarendon Press ; New York : Oxford University Press, 1992-<1995 >

Parallel algorithms in computational science

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索取号:TP3/E996
作者:Heermann、 Dieter W.、Burkitt、 A. N. (Anthony N.)、
出版社:Berlin ; New York : Springer-Verlag, 1991.

Principles of computer science : concepts, algorithms, data structures, and applications

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索取号:TP3/E909
作者:Carberry、 M. S.、Cohen、 A. Toni.、Khalil、 Hatem M.、
出版社:U.S.A. Rockville, Md. : Computer Science Press, 1986.

Foundations of computer science

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索取号:TP3/E804
作者:Carberry、M.S.、Carberry、 M. S.、
出版社:Potomac, Md. : Computer Science Press, 1979.

Great ideas in computer science : a gentle introduction

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索取号:TP3/E9914
作者:Biermann、 Alan W.、 1939-、
出版社:Cambridge, Mass. : MIT Press, 1990.

Aspects and prospects of theoretical computer science : 6th International Meeting of Young Computer Scientists, Smolenice, Czechoslovakia, November 19-23, 1990 : proceedings

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索取号:TP3/E9910
作者:International Meeting of Young Computer Scientists (6th : 1990 : Smolenice、 Slovakia)、Dassow、 J.、Kelemen、 Jozef、 1951-、
出版社:Berlin ; New York : Springer-Verlag, 1990.

Proceedings

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索取号:TP29-53/E904/1
作者:IEEE International Conference on Office Automation (1st : 1984 : New Orleans、 La.)、Taylor、 R. W. (Robert William)、 1932-、Institute of Electrical and Electronics Engineers.、
出版社:Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton

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索取号:TP274-53/E801/1977
作者:International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、
出版社:London : The Institution, 1977.

Algebra for computer science

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索取号:TP274/E902
作者:G·Ⅱrding、 Lars、 1919-、Tambour、 Torbj·□ rn.、
出版社:New York : Springer-Verlag, 1988.

Electrical and electronic instrumentation

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索取号:TP274/E9016
作者:Chiang、 Hai Hung.、
出版社:New York : Wiley, 1984.

Multivariable control system design and applications : [proceedings of a conference held] 1-3 September 1971, [at the] University of Manchester, Owens Park

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索取号:TP273-53/E808
作者:UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、
出版社:London, Institution of Electrical Engineers, 1971.

European Conference on Electronic Design Automation (EDA84), 26-30 March 1984

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索取号:TP27-53/E902
作者:European Conference on Electronic Design Automation (1984 : University of Warwick)、Institution of Electrical Engineers. Electronics Division.、British Computer Society.、
出版社:London ; New York : Venue The Institution of Electrical Engineers, 1984.

1985 IEEE International Conference on Robotics and Automation, March 25-28, 1985, Marriott's Pavilion Hotel, St. Louis, Missouri

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索取号:TP252-53/E901/1985
作者:IEEE International Conference on Robotics and Automation (1985 : St. Louis、 Mo.)、IEEE Computer Society.、Institute of Electrical and Electronics Engineers.、
出版社:Silver Spring, MD : IEEE Computer Society Press ; Los Angeles CA : Order from IEEE Computer Society, 1984.

Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号:TP216-53/E901/1985
作者:IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.

Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

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索取号:TP216-53/E901/1982
作者:IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、
出版社:New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.
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