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0 索取号:TN406/E801 作者:IIT Research Institute.、Reliability Analysis Center (U.S.)、 出版社:Oxford ; New York : Pergamon Press, 1975, c 1976.
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0 索取号:TN4-62/E805 作者:Hamilton、 Thomas Daniel Scott.、 出版社:Maidenhead, Eng. : McGraw-Hill, c1977.
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0 索取号:TN153-53/E804/1972 作者:Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、 出版社:Chicago, Ill. : IITRI, 1972.
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0 索取号:TN11-53/E701/37 作者:Electronic Components Conference (37th : 1987 : Boston、 Mass.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society、Electronic Industries Association、 出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, 1987]
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0 索取号:TN11-53/E701/17 作者:Electronic Components Conference (17th : 1967 : Washington、 D.C.)、Schwartz、 Bernard、 Dr.、Morehouse、 C. K.、Institute of Electrical and Electronics Engineers.、Electronic Industries Association.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1967.
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0 索取号:R595.4/E20031 作者:Platt、 Jerome J.、 出版社:Cambridge, Mass. : Harvard University Press, 1997.
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0 索取号:TN1-53/E805 作者:International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、 出版社:[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
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0 索取号:X-012.658/E20041 作者:KʻУang、 Mei-tzʻУ.、Hong Kong Centre for Economic Research.、 出版社:Hong Kong : Published for Hong Kong Centre for Economic Research by Chinese University Press, c1990.
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0 索取号:TN304.16-53/E701 作者:International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、 Institute for Exploratory Research (U.S.)、 出版社:New York : Plenum Press, 1960.
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0 索取号:TS2/E20034 作者: 出版社:New York : M. Dekker, c1998.
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0 索取号:TM534.1-62/E801 作者:Hamer、 D. W. (Donald W.)、 1925-、Viclan、 Inc.、Electronic Industries Association. t. Standard: ceramic dielectric capacitors、 classes 1、 2 & 3.、 出版社:San Diego, Calif. : Viclan, Inc., 1975.
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0 索取号:TM22-53/E802/1975 作者:IEEE Symposium on Applications of Ferroelectrics (1975 : Albuquerque)、Institute of Electrical and Electronics Engineers. Group on Sonics and Ultrasonics.、United States. Army Research Office、 Durham、 N.C.、Sandia Laboratories.、IEEE Symposium on Applications of Ferroelectrics (1975 : Albuquerque). Proceedings of the 1975 IEEE Symposium on Applications of Ferroelectrics.、 出版社:New York : Gordon and Breach, 1976.
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0 索取号:TL5-53/E801/8 作者:International Conference on High Energy Accelerators、 8th、 Geneva、 Switzerland、 1971.、Blewett、 M. Hildred.、Vogt-Nilsen、 N.、International Union of Pure and Applied Physics.、European Organization for Nuclear Research.、 出版社:Geneva : European Organization for Nuclear Research, 1971.
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0 索取号:TL32/E601 作者:Hughes、 Donald James、 1915-、 出版社:Cambridge, Mass. : Addison-Wesley Pub. Co., 1953.
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0 索取号:TL-5/E601 作者:National Research Council (U.S.). Subcommittee on Radiobiology.、 出版社:Washington, 1954.
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0 索取号:O571/E991/1990 作者:Shanghai Institute of Nuclear Research.、 出版社:Shanghai : Beijing : Atomic Energy Pr., 1991.
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