 |
0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
|  |
0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
|
 |
0 索取号:TN312.2/E701 作者:Scanlan、 J. O、 出版社:New York : Wiley, [c1966].
|  |
0 索取号:F753.390/E20041 作者: 出版社:Singapore : Singapore department of statistics, 2000.
|
 |
0 索取号:TB33-532/E20041/5 作者:International Conference on Durability Analysis of Composite Systems (5th : 2001 : Tokyo、 Japan)、Miyano、 Yasushi.、 出版社:Lisse [Netherlands] ; Exton, PA : Balkema, c2002.
|  |
0 索取号:TN92/E20035 作者:Stavroulakis、 Peter.、 出版社:Boston : Artech House, c2003.
|
 |
0 索取号:O177.91/E20031 作者:Denkowski、 ZdzisłАw、 1940-、MiǵОrski、 StanisłАw、 1961-、Papageorgiou、 Nikolaos Socrates.、 出版社:Boston : Kluwer Academic Publishers, c2003.
|  |
0 索取号:R318.08/E20041 作者: 出版社:Georgetown, Tex. : Landes Bioscience/Eurekah.com ; New York : Kluwer Academic/Plenum Publishers, c2003.
|
 |
0 索取号:F830.91/E20042 作者:Raynes、 Sylvain.、Rutledge、 Ann.、 出版社:Oxford ; New York : Oxford University Press, 2003.
|  |
0 索取号:TN7-53/E20071/43.3 作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、 出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.
|
 |
0 索取号:TN7-53/E20071/43.2 作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、 出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.
|  |
0 索取号:TN7-53/E20071/43.1 作者:Midwest Symposium on Circuits and Systems (43rd : 2000 : Lansing、 Mich.)、IEEE Circuits and Systems Society.、Michigan State University. Dept. of Electrical Engineering.、 出版社:[New York] : Institute of Electrical and Electronics Engineers, c2000.
|
 |
0 索取号:Q14/E20032.5 作者:Krebs、 Charles J.、 出版社:北京 : 科学出版社, 2003.
|  |
0 索取号:O657/E20061-2 作者:Rubinson、 Kenneth A.、Rubinson、 Judith F.、 出版社:北京 : 科学出版社, 2003.
|
 |
0 索取号:F830.5/E905.8 作者:Jones、 Charles Parker、 1943-、 出版社:北京 : John Wiley & Sons ; Citic Publishing House, 2002.
|  |
0 索取号:F231.5/E20021.2-2 作者:Palepu、 Krishna G.、 1954-、Healy、 Paul M.、Bernard、 Victor L. (Victor Lewis)、 1952-、 出版社:北京 : Thomson/South-Western ; CITIC Pub. House, 2002.
|