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0 索取号:TP312-532/E991/11 作者:Workshop on Languages and Compilers for Parallel Computing (11th : 1998 : Chapel Hill、 NC、USA)、Chatterjee、 Siddhartha.、 出版社:Berlin ; New York : Springer, c1999.
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0 索取号:R445-532/E994/1999 作者:International Conference on Medical Image Computing and Computer-Assisted Intervention (2nd : 1999 : Cambridge、 England)、Taylor、 Chris (Christopher J.)、Colchester、 A. C. F. (Alan C. F.)、 出版社:New York : Springer, 1999.
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0 索取号:TP18/E20001 作者:Konar、 Amit.、 出版社:Boca Raton, Fla. : CRC Press, c2000.
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0 索取号:TN929.1/E20031/1998 作者:International Working Conference on Optical Network Design and Modelling (2nd : 1998 : Rome、 Italy)、De Marchis、 Giancarlo.、Sabella、 Roberto.、International Federation for Information Processing. Technical Committee 6.、 出版社:Boston : Kluwer Academic, c1999.
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0 索取号:R972/E803/17 作者:Richards (A. N.) Symposium、 17th、 King of Prussia、 Pa.、 1975.、Scriabine、 Alexander.、Sweet、 Charles S.、 出版社:New York : Spectrum Publications : distributed by Halsted Press, 1976.
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0 索取号:TH74-55/E901/41 作者: 出版社:Palos Verdes Estates, Calif. : [Society of Photo-optical Instrumentation Engineers, 1974]
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0 索取号:TL1/E801 作者:Connolly、 Thomas J.、 1923-、 出版社:New York : Wiley, 1978.
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0 索取号:TL341.4-53/E801/3 作者:International Conference on Zirconium in the Nuclear Industry、 3d、 QúЕbec、 QúЕbec、 1976.、Lowe、 A. L.、Parry、 G. W.、ASTM Committee B-10 on Reactive and Refractory Metals and Alloys.、 出版社:Philadelphia : ASTM, 1977.
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0 索取号:TM93-53/E902/11 作者:Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
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0 索取号:TM93-53/E901/1982 作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、 出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.
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0 索取号:TM93-53/E901/1983 作者:International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:Silver Spring, MD : IEEE Computer Society Press, 1983.
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0 索取号:TH74-55/E901/231 作者:International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, 1980.
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0 索取号:TH74-55/E901/232.2 作者:International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, c1980.
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0 索取号:TH74-55/E901/239 作者: 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, c1981.
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0 索取号:TH74-55/E901/245 作者: 出版社:Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, c1980.
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0 索取号:TH74-55/E901/246 作者: 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, 1980.
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