大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Conference on Digital Instrumentation 的图书(共6478本)

Acousto-optics : device development, instrumentation, applications : August 26-27, 1976, San Diego, California

0
索取号:TN74-55/E902/90
作者:
出版社:Palo Verdes Estates, Calif. : The Society, 1976.

Sharing the sun : solar technology in the seventies : joint conference, American Section, International Solar Energy Society and Solar Energy Society of Canada, inc., August 15-20, 1976, Winnipeg

0
索取号:TK51-53/E802
作者:
出版社:Cape Canaveral, Fla. : American Section of the International Solar Energy Society, c1976.

Application of solar energy : proceedings of the First Southeastern Conference on Application of Solar Energy

0
索取号:TK519/E803
作者:Southeastern Conference on Application of Solar Energy、 1st、 Huntsville、 Ala.、 1975.、Wu、 Shi Tsan、 1933-、University of Alabama in Huntsville.、
出版社:Huntsville : UAH Press, 1975.

Solar cooling and dehumidifying : proceedings of the first international conference, SOLAR/80, Venezuela, 3-6 August 1980

0
索取号:TK519-53/E901/1980
作者:
出版社:Oxford ; New York : Pergamon Press, 1981.

Advanced reactors : physics, design, and economics : proceedings of the international conference held at Atlanta, Georgia, September 8-11, 1974

0
索取号:TL3-53/E802
作者:
出版社:Oxford : Pergamon Press, 1975.

Zirconium in the nuclear industry : proceedings of the Third International Conference, Quebec City, Canada, 10-12 Aug. 1976

0
索取号:TL341.4-53/E801/3
作者:International Conference on Zirconium in the Nuclear Industry、 3d、 QúЕbec、 QúЕbec、 1976.、Lowe、 A. L.、Parry、 G. W.、ASTM Committee B-10 on Reactive and Refractory Metals and Alloys.、
出版社:Philadelphia : ASTM, 1977.

Nuclear reactor shielding

0
索取号:TL351-53/E801/5
作者:International Conference on Reactor Shielding、 5th、 Knoxville、 Tenn.、 1977.、Roussin、 Robert W.、Abbott、 Lorraine S.、Bartine、 David E.、Oak Ridge National Laboratory.、United States. Energy Research and Development Administration.、
出版社:Princeton [N.J.] : Science Press, 1977.

Solid state nuclear track detectors : proceedings of the 9th international conference (Neuherberg/M̈Уnchen, 30th September-6th October, 1976

0
索取号:TL815-53/E801
作者:International Conference on Solid State Nuclear Track Detectors、 (9th、 Munich、 1976.)、Granzer、 F.、Paretzke、 H.、Schopper、 Erwin.、
出版社:Oxford ; New York : Pergamon Press, 1978.

Magnetic bubble technology : integrated-circuit magnetics for digital storage and processing

0
索取号:TM271/E801
作者:
出版社:New York : IEEE Press, 1975.

Applied electronic instrumentation and measurement

0
索取号:TM93/E991
作者:Buchla、 David.、McLachlan、 Wayne.、
出版社:New York : Merrill ; Toronto : Collier Macmillan Canada ; New York : Maxwell Macmillan International Pub. Group, c1992.

Elements of electronic instrumentation and measurement

0
索取号:TM93/E803
作者:Carr、 Joseph J.、
出版社:Reston, Va. : Reston Pub. Co., 1979.

Electronic instrumentation and measurement techniques

0
索取号:TM93/E804.2
作者:Cooper、 William David.、
出版社:Englewood Cliffs, N.J. : Prentice-Hall, 1978.

Electronic systems and instrumentation

0
索取号:TM93/E802
作者:Henry、 Richard W. (Richard Warfield)、 1932-、
出版社:New York : Wiley, 1978.

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980

0
索取号:TM93-53/E902/11
作者:Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982

0
索取号:TM93-53/E901/1982
作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、
出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983

0
索取号:TM93-53/E901/1983
作者:International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、
出版社:Silver Spring, MD : IEEE Computer Society Press, 1983.
最近添加的分类