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0 索取号:TP3/E9017.2 作者:Kindred、 Alton R.、 1922-、 出版社:Englewood Cliffs, N.J. : Prentice-Hall, 1980.
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0 索取号:TP3/E9911 作者: 出版社:New York : Plenum Press, 1990-<c1991 >
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0 索取号:TP3/E8013 作者:Ghosh、 Sakti P.、 出版社:New York : Academic Press, 1977.
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0 索取号:TP29-53/E901/1985 作者:IFIP TC 8 Working Conference on Office Systems (1985 : Helsinki、 Finland)、Verrijn Stuart、 A. A.、Hirschheim、 R. A. (Rudy A.)、International Federation for Information Processing. Technical Committee for Information Systems.、 出版社:Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
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0 索取号:B841/E991 作者:Heiman、 Gary W.、 出版社:Boston : Houghton-Mifflin Co., c1995.
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0 索取号:TP29-53/E991/1992.1 作者:IEEE International Symposium on Industrial Electronics (1st 1992 : Xi'an、 Shaanxi Sheng、 China)、IEEE Industrial Electronics Society.、 出版社:Xian Holiday Inn. Piscataway, NJ : IEEE Service Center, 1992.
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0 索取号:TP29/E9012.4 作者:Place、 Irene Magdaline Glazik、 1912-、Yetka、 Alice M.、Place、 Irene Magdaline Glazik、 1912- Office management.、 出版社:N.Y. Englewood Cliffs, N.J. : Prentice-Hall, 1986.
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0 索取号:TP29/E904 作者: 出版社:New York : Plenum, 1984.
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0 索取号:TP274-53/E991/3 作者:IFIP TC6 International Workshop on Protocol Test Systems (3rd : 1990 : McLean、 Va.)、Davidson、 Ian、 1944-、Litwack、 David M.、International Federation for Information Processing. Technical Committee 6.、Corporation for Open Systems International.、 出版社:Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1991.
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0 索取号:F273/E9912.5 作者:Stevenson、 William J.、 出版社:Chicago, IL : Irwin, c1996.
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0 索取号:C93/E9925.6 作者: 出版社:Chicago : IRWIN, c1996.
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0 索取号:TP273/E904 作者: 出版社:Amsterdam ; New York : North-Holland Pub. Co. ; New York : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1982.
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0 索取号:TP271.7/E801/4.3 作者:IFAC Symposium on Identification and System Parameter Estimation (4th : 1976 : Tiflis、 Georgian S.S.R.)、RăИbman、 N. S. (Naum SamŏИlovich)、Akademi︠И︡А nauk SSSR.、Na︠Т︡СionalʹНy̆И komitet Sovetskogo So︠И︡Уza po avtomaticheskomu upravleni︠И︡У.、SakʻАrtʻЖelos SSR mecʻНierebatʻА akademia.、International Federation of Automatic Control.、International Federation of Automatic Control. Technical Committee on Theory.、International Federation of Automatic Control. Technical Committee on Applications.、 出版社:Amsterdam ; New York : North-Holland Pub. Co., 1976,c1978.
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0 索取号:TP271.7/E801/4.2 作者:IFAC Symposium on Identification and System Parameter Estimation (4th : 1976 : Tiflis、 Georgian S.S.R.)、RăИbman、 N. S. (Naum SamŏИlovich)、Akademi︠И︡А nauk SSSR.、Na︠Т︡СionalʹНy̆И komitet Sovetskogo So︠И︡Уza po avtomaticheskomu upravleni︠И︡У.、SakʻАrtʻЖelos SSR mecʻНierebatʻА akademia.、International Federation of Automatic Control.、International Federation of Automatic Control. Technical Committee on Theory.、International Federation of Automatic Control. Technical Committee on Applications.、 出版社:Amsterdam ; New York : North-Holland Pub. Co., 1976,c1978.
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0 索取号:TP271.7/E801/4.1 作者:IFAC Symposium on Identification and System Parameter Estimation (4th : 1976 : Tiflis、 Georgian S.S.R.)、RăИbman、 N. S. (Naum SamŏИlovich)、Akademi︠И︡А nauk SSSR.、Na︠Т︡СionalʹНy̆И komitet Sovetskogo So︠И︡Уza po avtomaticheskomu upravleni︠И︡У.、SakʻАrtʻЖelos SSR mecʻНierebatʻА akademia.、International Federation of Automatic Control.、International Federation of Automatic Control. Technical Committee on Theory.、International Federation of Automatic Control. Technical Committee on Applications.、 出版社:Amsterdam ; New York : North-Holland Pub. Co., 1976,c1978.
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0 索取号:TP271.7/E801/3.2 作者:IFAC Symposium on Identification and System Parameter Estimation (3rd : 1973 : Delft University of Technology)、Eykhoff、 Pieter、 1929- ed.、Instituut van Ingenieurs. Division for Automatic Control.、International Federation of Automatic Control.、International Federation of Automatic Control. Technical Committee on Theory.、International Federation of Automatic Control. Technical Committee on Applications.、 出版社:London Amsterdam, North-Holland Pub. Co.; New York, American Elsevier, 1973.
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