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0 索取号:TM7/E801.2 作者:Guile、 Alan Elliott.、Paterson、 William、 B. Sc.、 joint author.、 出版社:Oxford ; New York : Pergamon Press, 1977.
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0 索取号:TM7/E901 作者: 出版社:New York : Wiley, 1982.
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0 索取号:TM765/E901 作者:Arrillaga、 J.、Arnold、 C. P.、Harker、 B. J.、 出版社:Chichester ; New York : Wiley, 1983.
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0 索取号:TM765-53/E901/1979.1 作者:Symposium on Computer Applications in Large Scale Power Systems (1979 : New Delhi、 India)、Subramanyam、 B. R.、International Federation of Automatic Control.、 出版社:Oxford ; New York : Published for the International Federation of Automatic Control by Pergamon Press, l980.
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0 索取号:TM765-53/E901/1979.2 作者:Symposium on Computer Applications in Large Scale Power Systems (1979 : New Delhi、 India)、Subramanyam、 B. R.、International Federation of Automatic Control.、 出版社:Oxford ; New York : Published for the International Federation of Automatic Control by Pergamon Press, l980.
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0 索取号:TM765-53/E901/1979.3 作者:Symposium on Computer Applications in Large Scale Power Systems (1979 : New Delhi、 India)、Subramanyam、 B. R.、International Federation of Automatic Control.、 出版社:Oxford ; New York : Published for the International Federation of Automatic Control by Pergamon Press, l980.
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0 索取号:TM914.4-53/E901/2 作者:Symposium on Materials and New Processing Technologies for Photovoltaics (2nd : 1980 : Hollywood、 Fla.)、Amick、 James A.、Electrochemical Society. Dielectrics and Insulation Division.、 出版社:Pennington, NJ (10 S. Main St., Pennington 08534) : Electrochemical Society, c1981.
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0 索取号:TM93/E802 作者:Henry、 Richard W. (Richard Warfield)、 1932-、 出版社:New York : Wiley, 1978.
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0 索取号:TM93-53/E902/11 作者:Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
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0 索取号:TM93-53/E901/1982 作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、 出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.
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0 索取号:TM93-53/E901/1983 作者:International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:Silver Spring, MD : IEEE Computer Society Press, 1983.
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0 索取号:TM930.9/E901 作者:Wist、 Abund Ottokar.、Meiksin、 Z. H.、 出版社:New York Englewood Cliffs, N.J. : Prentice-Hall, Business and Professional Division, 1986.
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0 索取号:TM133/E901 作者:Scott、 Donald E.、 出版社:New York : McGraw-Hill, 1987.
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0 索取号:TM248/E901.2 作者:Schubert、 Werner.、 出版社:Berlin : Siemens Aktiengesellschaft, 1982, c1976.
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0 索取号:TH74-55/E901/256 作者: 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, c1980.
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0 索取号:TH833.07/E801.2 作者:Walker、 John Q.、Jackson、 Minor T.、 joint author.、Maynard、 James B.、 joint author.、 出版社:New York : Academic Press, 1977.
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