搜索包含 Haifa International Workshop 的图书 - 暨南大学图书馆

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	Pattern recognition in practice : proceedings of an international workshop held in Amsterdam, May 21-23, 1980 0 索取号：TN27-53/E901 作者：出版社：Amsterdam ; New York : North-Holland Pub. Co. ; New York, N.Y. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1980.		Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 0 索取号：TN27-53/E806/1976 作者：Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、出版社：[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Time-varying image processing and moving object recognition : proceedings of the international workshop, Florence, Italy, September 8-9, 1986 0 索取号：TN27-53/E902 作者：出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1987.
	International business 0 索取号：F740/E20031.4 作者：Czinkota、 Michael R.、Ronkainen、 Ilkka A.、Moffett、 Michael H.、出版社：Beijing China Machine Press Fort Worth : Dryden Press, c1996.		International relations : conflict and cooperation at the turn of the 21st century 0 索取号：D81/E994 作者：Henderson、 Conway W.、出版社：Boston : McGraw Hill, c1998.
	International politics on the world stage 0 索取号：D81/E9911 作者：Rourke、 John T.、 1945-、Boyer、 Mark A.、出版社：Guilford,Connecticut : Dushkin/McGraw.Hill., c1996.		Computer science logic : 13th international workshop, CSL '99 : 8th annual conference of the EACSL, Madrid, Spain, September 20-25, 1999 : proceedings 0 索取号：TP302.2-532/E20011/1999 作者：Workshop on Computer Science Logic (13th : 1999 : Madrid、 Spain)、Flum、 Jörg.、Rodríguez Artalejo、 M. (Mario)、European Association for Computer Science Logic. Conference (8th : 1999 : Madrid、 Spain)、出版社：Berlin ; New York : Springer, c1999.
	Scale-space theories in computer vision : second international conference, Scale-Space'99, Corfu, Greece, September 26-27, 1999 : proceedings 0 索取号：TP391.4-532/E20013 作者：Scale-Space'99 (1999 : Corfu、 Greece)、Nielsen、 Mads、出版社：Berlin ; New York : Springer-Verlag, 1999.		Intelligent agents for telecommunicationapplications : Third International Workshop, IATA'99, Stockholm, Sweden, August 1999: proceedings 0 索取号：TN91-532/E20011 作者：International Workshop on Intelligent Agents for Telecommunication Applications (3rd : 1999 : Stockholm、 Sweden)、Albayrak、 Sahin.、出版社：New York : Springer, 1999.
	Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979		Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978 0 索取号：TN153-53/E801/10.3 作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.
	Laser spectroscopy : [proceedings] 0 索取号：O433.54-532/E991/1 作者：International Conference on Laser Spectroscopy (1st : 1973 : Vail、 Colo.)、Brewer、 Richard G.、 ed.、Mooradian、 Aram、 1937- ed.、International Business Machines Corporation.、出版社：New York, Plenum Press 1973,c[1974].		NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.
	NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland 0 索取号：TN303-53/E902/5 作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、出版社：Dún Laoghaire : Boole, 1987		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.

	Pattern recognition in practice : proceedings of an international workshop held in Amsterdam, May 21-23, 1980 0 索取号：TN27-53/E901 作者：出版社：Amsterdam ; New York : North-Holland Pub. Co. ; New York, N.Y. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1980.		Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 0 索取号：TN27-53/E806/1976 作者：Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、出版社：[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.
	Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif 0 索取号：TN27-53/E904/1980 作者：Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、出版社：New York IEEE Los Alamitos, CA : The Society, c1980.		Time-varying image processing and moving object recognition : proceedings of the international workshop, Florence, Italy, September 8-9, 1986 0 索取号：TN27-53/E902 作者：出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1987.
	International business 0 索取号：F740/E20031.4 作者：Czinkota、 Michael R.、Ronkainen、 Ilkka A.、Moffett、 Michael H.、出版社：Beijing China Machine Press Fort Worth : Dryden Press, c1996.		International relations : conflict and cooperation at the turn of the 21st century 0 索取号：D81/E994 作者：Henderson、 Conway W.、出版社：Boston : McGraw Hill, c1998.
	International politics on the world stage 0 索取号：D81/E9911 作者：Rourke、 John T.、 1945-、Boyer、 Mark A.、出版社：Guilford,Connecticut : Dushkin/McGraw.Hill., c1996.		Computer science logic : 13th international workshop, CSL '99 : 8th annual conference of the EACSL, Madrid, Spain, September 20-25, 1999 : proceedings 0 索取号：TP302.2-532/E20011/1999 作者：Workshop on Computer Science Logic (13th : 1999 : Madrid、 Spain)、Flum、 Jörg.、Rodríguez Artalejo、 M. (Mario)、European Association for Computer Science Logic. Conference (8th : 1999 : Madrid、 Spain)、出版社：Berlin ; New York : Springer, c1999.
	Scale-space theories in computer vision : second international conference, Scale-Space'99, Corfu, Greece, September 26-27, 1999 : proceedings 0 索取号：TP391.4-532/E20013 作者：Scale-Space'99 (1999 : Corfu、 Greece)、Nielsen、 Mads、出版社：Berlin ; New York : Springer-Verlag, 1999.		Intelligent agents for telecommunicationapplications : Third International Workshop, IATA'99, Stockholm, Sweden, August 1999: proceedings 0 索取号：TN91-532/E20011 作者：International Workshop on Intelligent Agents for Telecommunication Applications (3rd : 1999 : Stockholm、 Sweden)、Albayrak、 Sahin.、出版社：New York : Springer, 1999.
	Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979		Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978 0 索取号：TN153-53/E801/10.3 作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.
	Laser spectroscopy : [proceedings] 0 索取号：O433.54-532/E991/1 作者：International Conference on Laser Spectroscopy (1st : 1973 : Vail、 Colo.)、Brewer、 Richard G.、 ed.、Mooradian、 Aram、 1937- ed.、International Business Machines Corporation.、出版社：New York, Plenum Press 1973,c[1974].		NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.
	NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland 0 索取号：TN303-53/E902/5 作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、出版社：Dún Laoghaire : Boole, 1987		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.