ARPA/NBS workshop IV : surface analysis for silicon devices

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名称	ARPA/NBS workshop IV : surface analysis for silicon devices

索引号	TN345/E801
分类号	TN345 TN345(参数及测量) TN34(晶闸管（可控硅）) TN3(半导体技术) TN(无线电电子学、电信技术) T(工业技术)
作者
出版社	U.S. Department of Co. Washington : U.S. Dept. of Commerce, National Bureau of Standards ; [for sale by the Supt. of Docs., Govt. Print. Off.], 1976.
ISBN
页数	vii, 239 p. : ill. ; 27 cm.
价格
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简介
注解	"Contains the proceedings of the ARPA/NBS workshop IV, Surface analysis for silicon devices, held at the National Bureau of Standards on April 23-24, 1975." 附註 Includes bibliographical references and index.