Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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名称	Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

索引号	TN153-53/E804/1974
分类号	TN153-53/E804 TN15(光电器件、光电管) TN1(真空电子技术) TN(无线电电子学、电信技术) T(工业技术)
作者	Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社	Chicago Ill. : IIT Research Institute, 1973.
ISBN
页数	xvi, 1064 p. : ill. ; 29 cm.
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