大拱桥--暨南大学学生门户 » 图书馆 » 半导体技术 » Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices
| 名称 | Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices |
| 索引号 | TN3-53/E802/1978 |
| 分类号 | TN3-53/E802 TN3(半导体技术) TN(无线电电子学、电信技术) T(工业技术) |
| 作者 | Topical Conference on Characterization Techniques for Semiconductor Materials and Devices (1978 : Seattle、 Wash.)、Barnes、 Peter A.、Rozgonyi、 George A.、Electrochemical Society. Electronics Division.、 |
| 出版社 | Princeton, N.J. : Electrochemical Society, 1978. |
| ISBN | |
| 页数 | xi, 531 p. : ill. ; 23 cm. |
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