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名称 Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973
索引号 TN06-53/E801/11
分类号 TN06-53/E801
TN06(测试技术及设备)
TN0(一般性问题)
TN(无线电电子学、电信技术)
T(工业技术)
作者 International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社 New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
ISBN
页数 318 p. : ill. ; 28 cm.
价格
标签
简介
注解 "IEEE catalog no. 73 CHO 755-9 PHY." 附註 Includes bibliographical references.