大拱桥--暨南大学学生门户 » 图书馆 » 参数测试与检验 » Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J.
名称 Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J.
索引号 TN304.07-53/E801/1973
分类号 TN304.07-53/E801
TN304.07(参数测试与检验)
TN304.0(一般性问题)
TN304(材料)
TN30(一般性问题)
TN3(半导体技术)
TN(无线电电子学、电信技术)
T(工业技术)
作者 Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、
出版社 New York : IEEE, c1973.
ISBN
页数 v, 126 p. : ill. ; 27 cm.
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简介
注解 Reprinted in China. 附註 Includes bibliographical references.