Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J.

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名称	Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J.

索引号	TN304.07-53/E801/1977
分类号	TN304.07-53/E801 TN304.07(参数测试与检验) TN304.0(一般性问题) TN304(材料) TN30(一般性问题) TN3(半导体技术) TN(无线电电子学、电信技术) T(工业技术)
作者	Symposium on Semiconductor Memory Testing (1977 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、IEEE Computer Society. Philadelphia Chapter.、
出版社	New York : Institute of Electrical and Electronics Engineers, c1977.
ISBN
页数	198 p. : ill. ; 28 cm.
价格
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简介
注解	"Sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute of Electrical and Electronics Engineers."