Analysis and Design of Resilient VLSI Circuits [electronic resource] : Mitigating Soft Errors and Process Variations

大拱桥--暨南大学学生门户 » 图书馆 » | 08 环境公报 » Analysis and Design of Resilient VLSI Circuits [electronic resource] : Mitigating Soft Errors and Process Variations


名称	Analysis and Design of Resilient VLSI Circuits [electronic resource] : Mitigating Soft Errors and Process Variations

索引号
分类号	(\| 08 环境公报)
作者	Garg、 Rajesh.、Khatri、 Sunil P.、SpringerLink (Online service)、
出版社	Boston, MA : Springer US, 2010.
ISBN
页数	digital.
价格	doi
标签
简介
注解