搜索包含 Tarrant 的图书 - 暨南大学图书馆

大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Tarrant 的图书(共4本)

	Introducing Britain 0 索取号：H319.5/E8024 作者：Tarrant、 Dora.、出版社：London : Macmillan, 1974.		企業宦官 : この陥し穴からどう脱出するか 0 索取号：F272.9/J9054 作者：Battalia、 O. William、Tarrant、 J. John、朝山宗路、出版社：東京 : 実業之日本社, 1973.7
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Autotestcon '83, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1983 作者：Autotestcon '83 (1983 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, c1983.

	Introducing Britain 0 索取号：H319.5/E8024 作者：Tarrant、 Dora.、出版社：London : Macmillan, 1974.		企業宦官 : この陥し穴からどう脱出するか 0 索取号：F272.9/J9054 作者：Battalia、 O. William、Tarrant、 J. John、朝山宗路、出版社：東京 : 実業之日本社, 1973.7
	Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1985 作者：IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.		Autotestcon '83, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing 0 索取号：TP216-53/E901/1983 作者：Autotestcon '83 (1983 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、出版社：New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, c1983.