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0 索取号:P567.12/E601 作者:Blackwelder、 Eliot.、Geological Society of America.、 出版社:New York : The Society, 1931.
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0 索取号: 作者:Valavanis、 Kimon P.、Beard、 Randal.、Oh、 Paul.、Ollero、 An铆bal.、Piegl、 Leslie A.、Shim、 Hyunchui.、SpringerLink (Online service)、 出版社:Dordrecht : Springer Netherlands, 2010.
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0 索取号: 作者:Langs、 Georg.、Rish、 Irina.、Grosse-Wentrup、 Moritz.、Murphy、 Brian.、SpringerLink (Online service)、 出版社:Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
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0 索取号: 作者:Governatori、 Guido.、Hall、 John.、Paschke、 Adrian.、SpringerLink (Online service)、 出版社:Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
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0 索取号:D634.371.2/E20128 作者:Chung、 Sue Fawn、 1944-、Nevada State Museum.、 出版社:Charleston, S.C. : Arcadia Pub., c2011.
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0 索取号:K837.125.4/0002 作者:杜文杰、 出版社:海口 : 海南出版社, 1996
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0 索取号:TN019.2-7/E801/1987.1 作者:IEEE MTT-S International Microwave Symposium (1987 : Las Vegas、 Nev.)、Knorr、 Jeffrey B.、IEEE Microwave Theory and Techniques Society.、 出版社:[New York, NY : Institute of Electrical and Electronics Engineers, c1987]
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0 索取号:TN27-53/E903/1987 作者:Topical Meeting on Machine Vision (1987 : Incline Village、 Nev.)、Optical Society of America.、 出版社:Washington, DC : OSA, c1987.
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0 索取号:TP312-53/E902/7 作者:ACM Symposium on Principles of Programming Languages (7th : 1980 : Las Vegas、 Nev.)、ACM Special Interest Group for Automata and Computability Theory.、ACM Special Interest Group in Programming Languages.、 出版社:New York, N.Y. : ACM ; Baltimore, MD : May be ordered from ACM Order Dept., 1980.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:O6-55/E9029/2 作者: 出版社:Washington, D.C. : American Chemical Society, 1983.
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0 索取号:O6-55/E9021 作者: 出版社:Washington, D.C. : American Chemical Society, 1983.
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0 索取号:O6-55/E907 作者: 出版社:Washington, D.C. : American Chemical Society, 1981.
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0 索取号:O6-55/E9011 作者: 出版社:Washington, D.C. : American Chemical Society, 1981.
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