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0 索取号:O35/E8013.10 作者:Finnemore、 E. John.、Franzini、 Joseph B.、 出版社:北京 : 清华大学出版社, 2003.
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0 索取号:TN304.83/E801/9.2 作者:International Conference on Amorphous and Liquid Semiconductors (9th : 1981 : Grenoble、 France)、Chakraverty、 B. K.、Kaplan、 D.、International Union of Pure and Applied Physics.、 出版社:[Paris] : Éditions de physique, 1981.
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0 索取号:TN304.83/E801/9.1 作者:International Conference on Amorphous and Liquid Semiconductors (9th : 1981 : Grenoble、 France)、Chakraverty、 B. K.、Kaplan、 D.、International Union of Pure and Applied Physics.、 出版社:[Paris] : Éditions de physique, 1981.
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0 索取号:TN304.23-53/E701/1966 作者: 出版社:London : Institute of Physics & the Physical Society, 1967].
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0 索取号:TN209-53/E801/1972 作者:Conference on Electro-optic Systems in Flow Measurement (1972 : Southampton)、The Departments of Electronics and Mathematics.、Institute of Physics.、 出版社:Southampton : University of Southampton, 1972.
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0 索取号:TN153-53/E803/1977 作者: 出版社:Bristol : Institute of Physics, 1977.
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0 索取号:TB13-43/E701.4 作者:Bueche、 F. (Frederick)、 1923-、 出版社:New York : McGraw-Hill, c1986.
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0 索取号:O4/E20031/1 作者:Duncan、 Tom.、 出版社:London : John Murray, 1992
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0 索取号:O4/E908.2 作者:Duncan、 Tom、 1922-、 出版社:London : Murray, 1987.
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0 索取号:O1/E20031.2 作者:Lowe、 T. L.、Rounce、 John.、 出版社:Cheltenham : Thornes, 1992.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:TN301/E901 作者:Jaros、 M.、 出版社:Oxford [England] : Clarendon Press ; New York : Oxford University Press, 1989.
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0 索取号:TU311-532/E20042/17 作者:Australasian Conference on the Mechanics of Structures and Materials (17th : 2002: Gold Coast、 (Qld.))、Loo、 Yew-Chaye.、Chowdhury、 Sanaul H.、Fragomeni、 Sam.、 出版社:Lisse ; Exton, Pa. : Balkema, c2002.
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0 索取号:O411.1/E20031 作者:West、 Bruce J.、Bologna、 Mauro.、Grigolini、 Paolo.、 出版社:New York : Springer, c2003.
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