搜索包含 Symposium on Electron 的图书 - 暨南大学图书馆

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	Symposium proceedings : 1981 University/Government/Industry Microelectronics Symposium 0 索取号：TN4-53/E902/4 作者：University/Government/Industry Microelectronics Symposium (4th : 1981 : Mississippi State University、 Starkville、 Miss.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society.、National Science Foundation (U.S.).、International Society for Hybrid Microelectronics.、出版社：Piscataway, N.J. : IEEE [distributor], 1981		Proceedings, the Eighteenth International Symposium on Multiple-Valued Logic [electronic resource] : May 24-26, 1988, Palma de Mallorca, Spain 0 索取号：TP331.1-53/E901/18 作者：International Symposium on Multiple-Valued Logic (18th : 1988 : Palma、 Spain)、IEEE Xplore (Online service)、IEEE Computer Society.、出版社：Washington, DC : IEEE Computer Society Press ; Los Angeles, CA : order from IEEE Computer Society, c1988.
	Proceedings of the Symposium on Optical and Acoustical Micro-Electronics, New York, N.Y., April 16-18, 1974 0 索取号：TN4-53/E802/1974 作者：Symposium on Optical and Acoustical Micro-Electronics、 New York、 1974.、Fox、 Jerome.、Schlam、 Mark Howard.、Polytechnic Institute of New York. Microwave Research Institute.、出版社：Brooklyn, N.Y. : Polytechnic Press : distributors, Halsted Press, 1975.		1970 International Hybrid Microelectronics Symposium 0 索取号：TN4-53/E803/5 作者：International Hybrid Microelectronics Symposium (5th : 1970 : Beverly Hills、 Calif.)、Marshall、 Samuel L. (Samuel Louis)、 1908-、Haggerty、 David.、International Society for Hybrid Microelectronics.、出版社：Park Ridge, Ill.] : International Society for Hybrid Microelectronics, [1970].
	Electron microscopy of thin crystals 0 索取号：TN27/E801 作者：Hirsch、 P. B. (Peter Bernhard)、出版社：London Buterworth Huntington, N.Y. : R. E. Krieger Pub. Co., 1965,c1977.		Gasdynamic and chemical lasers : proceedings of the international symposium, 11-15 October 1976, K̈Оln 0 索取号：TN248-53/E801/1976 作者：出版社：K̈Оln-Porz, Germany : DFVLR-Press, 1976,c[1977?]
	Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]		Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.
	14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.		Electron energy loss spectroscopy and surface vibrations 0 索取号：TN01/E901 作者：Ibach、 H.、 1941-、Mills、 D. L.、出版社：New York : Academic Press, 1982.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Advanced scanning electron microscopy and X-ray microanalysis 0 索取号：TN153/E901 作者：出版社：New York : Plenum Press, 1986.
	The chemical applications of transmission electron microscopy 0 索取号：TN153/E802 作者：Fryer、 J. R.、出版社：London ; New York : Academic Press, 1979.		Quantitative scanning electron microscopy 0 索取号：TN153/E801 作者：出版社：London ; New York : Academic Press, 1974.

	Symposium proceedings : 1981 University/Government/Industry Microelectronics Symposium 0 索取号：TN4-53/E902/4 作者：University/Government/Industry Microelectronics Symposium (4th : 1981 : Mississippi State University、 Starkville、 Miss.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society.、National Science Foundation (U.S.).、International Society for Hybrid Microelectronics.、出版社：Piscataway, N.J. : IEEE [distributor], 1981		Proceedings, the Eighteenth International Symposium on Multiple-Valued Logic [electronic resource] : May 24-26, 1988, Palma de Mallorca, Spain 0 索取号：TP331.1-53/E901/18 作者：International Symposium on Multiple-Valued Logic (18th : 1988 : Palma、 Spain)、IEEE Xplore (Online service)、IEEE Computer Society.、出版社：Washington, DC : IEEE Computer Society Press ; Los Angeles, CA : order from IEEE Computer Society, c1988.
	Proceedings of the Symposium on Optical and Acoustical Micro-Electronics, New York, N.Y., April 16-18, 1974 0 索取号：TN4-53/E802/1974 作者：Symposium on Optical and Acoustical Micro-Electronics、 New York、 1974.、Fox、 Jerome.、Schlam、 Mark Howard.、Polytechnic Institute of New York. Microwave Research Institute.、出版社：Brooklyn, N.Y. : Polytechnic Press : distributors, Halsted Press, 1975.		1970 International Hybrid Microelectronics Symposium 0 索取号：TN4-53/E803/5 作者：International Hybrid Microelectronics Symposium (5th : 1970 : Beverly Hills、 Calif.)、Marshall、 Samuel L. (Samuel Louis)、 1908-、Haggerty、 David.、International Society for Hybrid Microelectronics.、出版社：Park Ridge, Ill.] : International Society for Hybrid Microelectronics, [1970].
	Electron microscopy of thin crystals 0 索取号：TN27/E801 作者：Hirsch、 P. B. (Peter Bernhard)、出版社：London Buterworth Huntington, N.Y. : R. E. Krieger Pub. Co., 1965,c1977.		Gasdynamic and chemical lasers : proceedings of the international symposium, 11-15 October 1976, K̈Оln 0 索取号：TN248-53/E801/1976 作者：出版社：K̈Оln-Porz, Germany : DFVLR-Press, 1976,c[1977?]
	Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]		Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.
	14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.		Electron energy loss spectroscopy and surface vibrations 0 索取号：TN01/E901 作者：Ibach、 H.、 1941-、Mills、 D. L.、出版社：New York : Academic Press, 1982.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Advanced scanning electron microscopy and X-ray microanalysis 0 索取号：TN153/E901 作者：出版社：New York : Plenum Press, 1986.
	The chemical applications of transmission electron microscopy 0 索取号：TN153/E802 作者：Fryer、 J. R.、出版社：London ; New York : Academic Press, 1979.		Quantitative scanning electron microscopy 0 索取号：TN153/E801 作者：出版社：London ; New York : Academic Press, 1974.