搜索包含 test 的图书 - 暨南大学图书馆

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	New Rudman's questions and answers on the GRE General (Aptitude) Test 0 索取号：H31-44/E998 作者：Rudman、 Jack.、National Learning Corporation (Syosset、 N.Y.)、出版社：Syosset, N. Y. : National Learning Corporation, 1992.		Test your English 0 索取号：H31-44/E904 作者：Fowler、 W. S. (William Stewart)、Coe、 Norman.、出版社：Walton-on-Thames, Surrey : Nelson, [1977-1980]
	Graduate record examination aptitude test : revised to conform to latest exam 0 索取号：G642.47-51/E801 作者：Gruber、 Edward C.、Gruber、 Gary R.、出版社：New York : ARCO Pub., c1978.		Detergency; theory and test methods 0 索取号：TQ423/E802 作者：出版社：New York : M. Dekker, 1972-[81]
	NBS FORTRAN test programs 0 索取号：TP314/E803 作者：Holberton、 Frances E.、Parker、 Elizabeth G.、 joint author.、United States. National Bureau of Standards.、出版社：[Washington] National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.		Heinle & Heinle's complete guide to the TOEFL test, CBT ed. 0 索取号：作者：Rogers、 Bruce、 1949-、出版社：Boston : Heinle & Heinle/Thomson Learning, c2001.
	Protocol test systems, III : proceedings of the IFIP TC6 Third International Workshop on Protocol Test Systems 0 索取号：TP274-53/E991/3 作者：IFIP TC6 International Workshop on Protocol Test Systems (3rd : 1990 : McLean、 Va.)、Davidson、 Ian、 1944-、Litwack、 David M.、International Federation for Information Processing. Technical Committee 6.、Corporation for Open Systems International.、出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1991.		Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 0 索取号：TP216-53/E902/1983 作者：出版社：N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.
	ATE : automatic test equipment 0 索取号：TP216/E901 作者：Stover、 Allan C.、出版社：New York : McGraw-Hill Book Co., 1984.		Language test construction and evaluation 0 索取号：H09/E20003 作者：Alderson、 J. Charles.、Clapham、 Caroline.、Wall、 Dianne.、出版社：Beijing Foreign Language Teaching and Research Press 2000
	TOEIC official test-preparation guide 0 索取号：H310.41/E20071.2 作者：出版社：[Lawrenceville, N.J.?] : Thomson/Peterson's, c2001.		Test process improvement : a practical step-by-step guide to structured testing = 测试过程改进 : 结构化测试循序渐进实用指南 0 索取号：TP311.5/E20062 作者：Koomen、 Tim.、Pol、 Martin.、出版社：北京 : 高等敎育出版社, 2003.
	Design and development of medical electronic instrumentation : a practical perspective of the design, construction, and test of medical devices 0 索取号：TH772/E20051 作者：Prutchi、 David.、Norris、 Michael.、出版社：Hoboken, N.J. : Wiley-Interscience, c2005.		Test item file, Operations management, fourth edition, Roberta S.Russell, Bernard W.Taylor 0 索取号：F273/E20052 作者：Fink、 Ross L.、Russell、 Roberta S. Operations management. 4th ed.、Taylor、 Bernard W.、出版社：Upper Saddle River, N.J. : Pearson Education, c2003.
	MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing :9-10 August, 2004, San Jose, California, USA 0 索取号：TP333-53/E20051/12 作者：IEEE International Workshop on Memory Technology、 Design and Testing (12th : 2004 : San Jose、 Calif.)、Rajsuman、 Rochit.、Wik、 T. (Thomas)、IEEE Computer Society.、IEEE Computer Society. Technical Committee on VLSI.、IEEE Computer Society. Technical Council on Test Technology.、IEEE Solid-State Circuits Society.、出版社：Los Alamitos, Calif. : IEEE Computer Society, c2004.		Test item file 2, management, seventh edition, Stephen P. Robbins, Mary Coulter 0 索取号：C93-44/E20052 作者：Cates、 Tommy.、Robbins、 Stephen P.、 1943- Management. 7th ed.、Overby、 John.、出版社：Upper Saddle River, N.J. : Prentice Hall, c2002.

	New Rudman's questions and answers on the GRE General (Aptitude) Test 0 索取号：H31-44/E998 作者：Rudman、 Jack.、National Learning Corporation (Syosset、 N.Y.)、出版社：Syosset, N. Y. : National Learning Corporation, 1992.		Test your English 0 索取号：H31-44/E904 作者：Fowler、 W. S. (William Stewart)、Coe、 Norman.、出版社：Walton-on-Thames, Surrey : Nelson, [1977-1980]
	Graduate record examination aptitude test : revised to conform to latest exam 0 索取号：G642.47-51/E801 作者：Gruber、 Edward C.、Gruber、 Gary R.、出版社：New York : ARCO Pub., c1978.		Detergency; theory and test methods 0 索取号：TQ423/E802 作者：出版社：New York : M. Dekker, 1972-[81]
	NBS FORTRAN test programs 0 索取号：TP314/E803 作者：Holberton、 Frances E.、Parker、 Elizabeth G.、 joint author.、United States. National Bureau of Standards.、出版社：[Washington] National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.		Heinle & Heinle's complete guide to the TOEFL test, CBT ed. 0 索取号：作者：Rogers、 Bruce、 1949-、出版社：Boston : Heinle & Heinle/Thomson Learning, c2001.
	Protocol test systems, III : proceedings of the IFIP TC6 Third International Workshop on Protocol Test Systems 0 索取号：TP274-53/E991/3 作者：IFIP TC6 International Workshop on Protocol Test Systems (3rd : 1990 : McLean、 Va.)、Davidson、 Ian、 1944-、Litwack、 David M.、International Federation for Information Processing. Technical Committee 6.、Corporation for Open Systems International.、出版社：Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1991.		Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 0 索取号：TP216-53/E902/1983 作者：出版社：N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.
	ATE : automatic test equipment 0 索取号：TP216/E901 作者：Stover、 Allan C.、出版社：New York : McGraw-Hill Book Co., 1984.		Language test construction and evaluation 0 索取号：H09/E20003 作者：Alderson、 J. Charles.、Clapham、 Caroline.、Wall、 Dianne.、出版社：Beijing Foreign Language Teaching and Research Press 2000
	TOEIC official test-preparation guide 0 索取号：H310.41/E20071.2 作者：出版社：[Lawrenceville, N.J.?] : Thomson/Peterson's, c2001.		Test process improvement : a practical step-by-step guide to structured testing = 测试过程改进 : 结构化测试循序渐进实用指南 0 索取号：TP311.5/E20062 作者：Koomen、 Tim.、Pol、 Martin.、出版社：北京 : 高等敎育出版社, 2003.
	Design and development of medical electronic instrumentation : a practical perspective of the design, construction, and test of medical devices 0 索取号：TH772/E20051 作者：Prutchi、 David.、Norris、 Michael.、出版社：Hoboken, N.J. : Wiley-Interscience, c2005.		Test item file, Operations management, fourth edition, Roberta S.Russell, Bernard W.Taylor 0 索取号：F273/E20052 作者：Fink、 Ross L.、Russell、 Roberta S. Operations management. 4th ed.、Taylor、 Bernard W.、出版社：Upper Saddle River, N.J. : Pearson Education, c2003.
	MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing :9-10 August, 2004, San Jose, California, USA 0 索取号：TP333-53/E20051/12 作者：IEEE International Workshop on Memory Technology、 Design and Testing (12th : 2004 : San Jose、 Calif.)、Rajsuman、 Rochit.、Wik、 T. (Thomas)、IEEE Computer Society.、IEEE Computer Society. Technical Committee on VLSI.、IEEE Computer Society. Technical Council on Test Technology.、IEEE Solid-State Circuits Society.、出版社：Los Alamitos, Calif. : IEEE Computer Society, c2004.		Test item file 2, management, seventh edition, Stephen P. Robbins, Mary Coulter 0 索取号：C93-44/E20052 作者：Cates、 Tommy.、Robbins、 Stephen P.、 1943- Management. 7th ed.、Overby、 John.、出版社：Upper Saddle River, N.J. : Prentice Hall, c2002.