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Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 3

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索取号:TN1-53/E901/1990.3
作者:IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1989

Conference proceedings

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索取号:TN1-53/E901/1987.1
作者:IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1987.

Conference proceedings

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索取号:TN1-53/E901/1987.2
作者:IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers, c1987.

Electronic devices and circuits

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索取号:TN11/E901.2
作者:Bell、 David A.、 1930-、
出版社:Reston, Va. : Reston Pub. Co., 1980.

Solid state electronic devices

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索取号:TN11/E801
作者:Streetman、 Ben G.、
出版社:Englewood Cliffs, N.J. : Prentice-Hall, [1972]

Optoelectronic devices and principles

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索取号:TN15/E991
作者:Mooney、 William J.、 1941-、
出版社:Englewood Cliffs, N.J. : Prentice Hall, c1991.

Advanced scanning electron microscopy and X-ray microanalysis

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索取号:TN153/E901
作者:
出版社:New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

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索取号:TN153/E802
作者:Fryer、 J. R.、
出版社:London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

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索取号:TN153/E801
作者:
出版社:London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号:TN153-53/E804/1974
作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社:Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号:TN153-53/E801/10.3
作者:International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社:West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Physics of semiconductor devices

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索取号:TN303/E991
作者:Shur、 Michael.、
出版社:Englewood Cliffs, N.J. : Prentice Hall, 1990.

Numerical analysis for semiconductor devices

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索取号:TN303/E903
作者:Kurata、 Mamoru.、
出版社:Lexington, Mass. : Lexington Books, c1982.

Semiconductor devices and integrated electronics

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索取号:TN303/E904
作者:Milnes、 A. G. (Arthur George)、 1922-、
出版社:New York : Van Nostrand Reinhold, 1980.

Industrial solid-state electronics : devices and systems

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索取号:TN303/E805
作者:Maloney、 Timothy J.、
出版社:Englewood Cliffs, N.J. : Prentice-Hall, 1979.

Bipolar semiconductor devices

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索取号:TN303/E993
作者:Roulston、 David J.、
出版社:New York : McGraw-Hill, 1990.
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