大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 College Research Group of Concord 的图书(共3845本)

Proceedings of the Joint Conference on Thick Film Technology, Monday, 8th April and Tuesday, 9th April, 1968, Imperial College, London

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索取号:TN451/E801.r/1968
作者:Joint Conference on Thick Film Technology (1968 : Imperial College、 London)、Institution of Electronic and Radio Engineers.、Institution of Electrical Engineers.、International Society for Hybrid Microelectronics.、
出版社:London : Institution of Electronic and Radio Engineers, [1970].

Hybrid microcircuit reliability data

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索取号:TN406/E801
作者:IIT Research Institute.、Reliability Analysis Center (U.S.)、
出版社:Oxford ; New York : Pergamon Press, 1975, c 1976.

The linear control circuits data book for design engineers

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索取号:TN4-62/E804
作者:Texas Instruments Incorporated. Semiconductor Group.、
出版社:Dallas : Texas Instruments, c1976.

Handbook of linear integrated electronics for research

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索取号:TN4-62/E805
作者:Hamilton、 Thomas Daniel Scott.、
出版社:Maidenhead, Eng. : McGraw-Hill, c1977.

The Second Symposium on Hybrid Microelectronics

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索取号:TN4/E704/2
作者:Symposium on Hybrid Microelectronics (2nd : 1967 : Boston、 Mass.)、Woulbroun、 John M.、 1932-、Doyle、 George A.、IEEE Parts、 Materials、 and Packaging Group. Boston Chapter.、International Society for Hybrid Microelectronics.、
出版社:[Palo Alto] : International Society for Hybrid Microelectronics; [obtained from Western Periodicals Co., North Hollywood, Calif., 1967].

Digest of technical papers

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索取号:TN402-53/E902/1986
作者:IEEE International Conference on Computer-Aided Design (1986 : Santa Clara、 Calif.)、IEEE Computer Society.、IEEE Circuits and Systems Society.、IEEE Electron Devices Society.、ACM Special Interest Group on Design Automation.、
出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.

The optoelectronics data book for design engineers

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索取号:TN202-62/E801.2
作者:Texas Instruments Incorporated. Semiconductor Group.、
出版社:Dallas, Tex. : Texas Instruments, 1975.

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77)

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索取号:TN153-53/E803/1977
作者:
出版社:Bristol : Institute of Physics, 1977.

Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA

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索取号:TN153-53/E804/1972
作者:Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、
出版社:Chicago, Ill. : IITRI, 1972.

Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974

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索取号:TN141-53/E801/1974
作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、
出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号:TN14-53/E801/11
作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社:San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号:TN14-53/E801/10
作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社:San Francisco : San Francisco Press, [c1969].

IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973

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索取号:TN102-53/E801/11
作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、
出版社:New York, N.Y. : IEEE, c1973.

Cocaine addiction : theory, research, and treatment

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索取号:R595.4/E20031
作者:Platt、 Jerome J.、
出版社:Cambridge, Mass. : Harvard University Press, 1997.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号:TN06-53/E801/11
作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号:TN06-53/E801/10
作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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