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0 索取号:TN11-53/E701/17 作者:Electronic Components Conference (17th : 1967 : Washington、 D.C.)、Schwartz、 Bernard、 Dr.、Morehouse、 C. K.、Institute of Electrical and Electronics Engineers.、Electronic Industries Association.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1967.
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0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
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0 索取号:R595.4/E20031 作者:Platt、 Jerome J.、 出版社:Cambridge, Mass. : Harvard University Press, 1997.
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0 索取号:TN1-53/E906 作者:International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、 出版社:Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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0 索取号:TN06-53/E802/1970 作者:Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:TN1-53/E805 作者:International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、 出版社:[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
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0 索取号:TN019.2-7/E801/1975 作者:IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、 出版社:Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
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0 索取号:TN019.2/E806/1972 作者:IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1972.
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0 索取号:TN-7/E801/1977 作者:International Electrical、 Electronics Conference and Exposition (1977 : Toronto、 Ont.)、Institute of Electrical and Electronics Engineers. Canadian Region.、 出版社:[s.l : IEEE, 1977]
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0 索取号:TN-53/E901 作者:Trends in Electronics Conference (3rd : 1987 : Seoul、 Korea)、Institute of Electrical and Electronics Engineers. Korea Section.、IEEE Region 10.、Taehan Chŏnja Konghakhoe.、 出版社:[New York : Institute of Electrical and Electronics Engineers, 1987]
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0 索取号:X-012.658/E20041 作者:KʻУang、 Mei-tzʻУ.、Hong Kong Centre for Economic Research.、 出版社:Hong Kong : Published for Hong Kong Centre for Economic Research by Chinese University Press, c1990.
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0 索取号:TN-53/E902/16 作者:Electronics and Aerospace Systems Conference (16th : 1983 : Washington、 D.C.)、Institute of Electrical and Electronics Engineers. Washington Section.、IEEE Aerospace and Electronic Systems Society.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1983.
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0 索取号:TN304.6/E801 作者:Antwerp Advanced Study Institute on Fr?hlich Polarons and Electron-Phonon Interaction in Polar Semiconductors (1971)、Devreese、 J. T. (Jozef T.)、 出版社:Amsterdam : North-Holland Publishing Company ; New York : American Elsevier Publishing Co., 1972.
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