大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Computer Networking Symposium (1981 : National Bureau of Standards) 的图书(共5895本)

Seventh National Conference on Electron Probe Analysis

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索取号:TN146.8-53/E801/7
作者:National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、
出版社:Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]

Sixth national conference on electron probe analysis : July 27-30, 1971

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索取号:TN146.8-53/E801/6
作者:National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、
出版社:Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.

Computer and communications security : strategies for the 1990s

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索取号:TP309/E20031
作者:Cooper、 James Arlin.、
出版社:New York : Intertext Publications, McGraw-Hill, c1989.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号:TN14-53/E801/11
作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社:San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号:TN14-53/E801/10
作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社:San Francisco : San Francisco Press, [c1969].

Time-saver standards for architectural design data

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索取号:TU318/E20031.6
作者:
出版社:New York : McGraw-Hill, 1983.

Proceedings

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索取号:TN1-53/E906
作者:International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、
出版社:Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984

Computerization and networking of materials data bases

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索取号:TP392-532/E20031/3
作者:
出版社:Philadelphia, PA : ASTM, c1992.

1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970

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索取号:TN06-53/E802/1970
作者:Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号:TN06-53/E801/11
作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号:TN06-53/E801/10
作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.

Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号:TN06-53/E801/9
作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Statistical sampling : past, present, and future theoretical and practical

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索取号:
作者:Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、
出版社:Philadelphia, PA : ASTM, c1990.

1975 IEEE MTT-S International Microwave Symposium : digest of technical papers

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索取号:TN019.2-7/E801/1975
作者:IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、
出版社:Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975

1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL

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索取号:TN019.2/E806/1972
作者:IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、
出版社:New York : Institute of Electrical and Electronics Engineers, 1972.

Optical information processing : [proceedings]

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索取号:TN27-53/E802
作者:US-USSR Science Cooperation Seminar on Optical Information Processing (1st : 1975 : Washington、 D.C.)、Stroke、 George W.、Kock、 Winston E.、Nesterikhin、 ︠и︡у. E.、National Science Foundation (U.S.)、
出版社:New York : Plenum Press, c1976.
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