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0 索取号:TN304.07-53/E801/1973 作者:Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、 出版社:New York : IEEE, c1973.
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0 索取号:TN24-53/E909/1982 作者:International Conference on Lasers (1982 : New Orleans、 La.)、Powell、 Richard C. (Richard Conger)、 1939-、Society for Optical & Quantum Electronics.、 出版社:McLean, VA : STS Press, 1982 [i.e. 1983].
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0 索取号:TN209-53/E801/1972 作者:Conference on Electro-optic Systems in Flow Measurement (1972 : Southampton)、The Departments of Electronics and Mathematics.、Institute of Physics.、 出版社:Southampton : University of Southampton, 1972.
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0 索取号:TN201-53/E901/14 作者:International Quantum Electronics Conference (14th : 1986 : San Francisco、 Calif.)、American Physical Society.、Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers)、Optical Society of America.、 出版社:[Washington, D.C.] : Optical Society of America, 1986.
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0 索取号:TN153-53/E803/1977 作者: 出版社:Bristol : Institute of Physics, 1977.
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0 索取号:TN146.8-53/E801/7 作者:National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、 出版社:Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
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0 索取号:TN146.8-53/E801/6 作者:National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、 出版社:Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.
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0 索取号:TN141-53/E801/1974 作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、 出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
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0 索取号:TN14-53/E801/11 作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、 出版社:San Francisco, Calif. : San Francisco Press, c1971.
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0 索取号:TN11-53/E701/37 作者:Electronic Components Conference (37th : 1987 : Boston、 Mass.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society、Electronic Industries Association、 出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, 1987]
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0 索取号:TN11-53/E701/17 作者:Electronic Components Conference (17th : 1967 : Washington、 D.C.)、Schwartz、 Bernard、 Dr.、Morehouse、 C. K.、Institute of Electrical and Electronics Engineers.、Electronic Industries Association.、 出版社:New York : Institute of Electrical and Electronics Engineers, 1967.
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0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
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0 索取号:TN102-53/E701.r/1967 作者:Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry (1967 : University of Nottingham)、Institution of Electronic and Radio Engineers.、Institution of Production Engineers (Great Britain)、Institution of Electrical Engineers. Electronics Division.、 出版社:London : Institution of Electronic and Radio Engineers, c1968.
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0 索取号:TN06-53/E801/9 作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0 索取号:TN019.2-53/E802/5 作者:European Microwave Conference、 5th、 Hamburg、 1975.、Schmitt、 H. J.、Nachrichtentechnische Gesellschaft.、 出版社:Sevenoaks : Microwave Exhibitions and Publishers Ltd, [1975].
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0 索取号: 作者:Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、 出版社:Philadelphia, PA : ASTM, c1990.
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