搜索包含 Proceedings of the Fourteenth Workshop 的图书 - 暨南大学图书馆

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	Proceedings of the Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry, Monday, 10th July to Thursday, 13th July, 1967 at the University of Nottingham 0 索取号：TN102-53/E701.r/1967 作者：Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry (1967 : University of Nottingham)、Institution of Electronic and Radio Engineers.、Institution of Production Engineers (Great Britain)、Institution of Electrical Engineers. Electronics Division.、出版社：London : Institution of Electronic and Radio Engineers, c1968.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	5th European Microwave Conference, Microwave 75, Monday 1 to Thursday 4 September 1975, Congress Centrum, Hamburg, Germany : conference proceedings 0 索取号：TN019.2-53/E802/5 作者：European Microwave Conference、 5th、 Hamburg、 1975.、Schmitt、 H. J.、Nachrichtentechnische Gesellschaft.、出版社：Sevenoaks : Microwave Exhibitions and Publishers Ltd, [1975].		Proceedings of MELECON '83 : Mediterranean Electrotechnical Conference, Athens, Greece, 24-26 May, 1983 0 索取号：TN1-53/E902/1983.2 作者：Mediterranean Electrotechnical Conference (1983 : Athens、 Greece)、Protonotarios、 E.N.、出版社：[S.l. : s.n.], [198-?].
	Proceedings of MELECON '83 : Mediterranean Electrotechnical Conference, Athens, Greece, 24-26 May, 1983 0 索取号：TN1-53/E902/1983.1 作者：Mediterranean Electrotechnical Conference (1983 : Athens、 Greece)、Protonotarios、 E.N.、出版社：[S.l. : s.n.], [198-?].		Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
	Proceedings of the Conference on Retraining in the Electronics Industry for the Microprocessor Age, the London Penta Hotel, Thursday, 3rd July 1980 0 索取号：TN01-53/E901/1980 作者：Conference on Retraining in the Electronics Industry for the Microprocessor Age (1980 : London、 England)、Institution of Electronic and Radio Engineers.、出版社：London : IERE, c1980.		Proceedings : TENCON 87, 1987 IEEE Region 10 conference : "computers and communications technology toward 2000" ; August 25-28, 1987, Sheraton Walker Hill Hotel, Seoul, Korea 0 索取号：TN-53/E901 作者：Trends in Electronics Conference (3rd : 1987 : Seoul、 Korea)、Institute of Electrical and Electronics Engineers. Korea Section.、IEEE Region 10.、Taehan Chŏnja Konghakhoe.、出版社：[New York : Institute of Electrical and Electronics Engineers, 1987]
	Optical information processing : [proceedings] 0 索取号：TN27-53/E802 作者：US-USSR Science Cooperation Seminar on Optical Information Processing (1st : 1975 : Washington、 D.C.)、Stroke、 George W.、Kock、 Winston E.、Nesterikhin、 ︠и︡у. E.、National Science Foundation (U.S.)、出版社：New York : Plenum Press, c1976.		Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.
	Proceedings 0 索取号：TP31-53/E9020/1985 作者：SOFTFAIR (1985 : San Francisco、 Calif.)、IEEE Computer Society.、ACM Sigsoft.、出版社：Washington, D.C. : IEEE Computer Society, c1985.		Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.

	Proceedings of the Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry, Monday, 10th July to Thursday, 13th July, 1967 at the University of Nottingham 0 索取号：TN102-53/E701.r/1967 作者：Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry (1967 : University of Nottingham)、Institution of Electronic and Radio Engineers.、Institution of Production Engineers (Great Britain)、Institution of Electrical Engineers. Electronics Division.、出版社：London : Institution of Electronic and Radio Engineers, c1968.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	5th European Microwave Conference, Microwave 75, Monday 1 to Thursday 4 September 1975, Congress Centrum, Hamburg, Germany : conference proceedings 0 索取号：TN019.2-53/E802/5 作者：European Microwave Conference、 5th、 Hamburg、 1975.、Schmitt、 H. J.、Nachrichtentechnische Gesellschaft.、出版社：Sevenoaks : Microwave Exhibitions and Publishers Ltd, [1975].		Proceedings of MELECON '83 : Mediterranean Electrotechnical Conference, Athens, Greece, 24-26 May, 1983 0 索取号：TN1-53/E902/1983.2 作者：Mediterranean Electrotechnical Conference (1983 : Athens、 Greece)、Protonotarios、 E.N.、出版社：[S.l. : s.n.], [198-?].
	Proceedings of MELECON '83 : Mediterranean Electrotechnical Conference, Athens, Greece, 24-26 May, 1983 0 索取号：TN1-53/E902/1983.1 作者：Mediterranean Electrotechnical Conference (1983 : Athens、 Greece)、Protonotarios、 E.N.、出版社：[S.l. : s.n.], [198-?].		Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
	Proceedings of the Conference on Retraining in the Electronics Industry for the Microprocessor Age, the London Penta Hotel, Thursday, 3rd July 1980 0 索取号：TN01-53/E901/1980 作者：Conference on Retraining in the Electronics Industry for the Microprocessor Age (1980 : London、 England)、Institution of Electronic and Radio Engineers.、出版社：London : IERE, c1980.		Proceedings : TENCON 87, 1987 IEEE Region 10 conference : "computers and communications technology toward 2000" ; August 25-28, 1987, Sheraton Walker Hill Hotel, Seoul, Korea 0 索取号：TN-53/E901 作者：Trends in Electronics Conference (3rd : 1987 : Seoul、 Korea)、Institute of Electrical and Electronics Engineers. Korea Section.、IEEE Region 10.、Taehan Chŏnja Konghakhoe.、出版社：[New York : Institute of Electrical and Electronics Engineers, 1987]
	Optical information processing : [proceedings] 0 索取号：TN27-53/E802 作者：US-USSR Science Cooperation Seminar on Optical Information Processing (1st : 1975 : Washington、 D.C.)、Stroke、 George W.、Kock、 Winston E.、Nesterikhin、 ︠и︡у. E.、National Science Foundation (U.S.)、出版社：New York : Plenum Press, c1976.		Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.
	Proceedings 0 索取号：TP31-53/E9020/1985 作者：SOFTFAIR (1985 : San Francisco、 Calif.)、IEEE Computer Society.、ACM Sigsoft.、出版社：Washington, D.C. : IEEE Computer Society, c1985.		Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.