 |
0
索取号：TN201-53/E901/14
作者：International Quantum Electronics Conference (14th : 1986 : San Francisco、 Calif.)、American Physical Society.、Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers)、Optical Society of America.、
出版社：[Washington, D.C.] : Optical Society of America, 1986.
| |
0
索取号：TN201/E701
作者：Pantell、 Richard H.、 1927-、Puthoff、 Harold E.、 joint author.、
出版社：New York : Wiley, [1969].
|
|
0
索取号：O6/E998
作者：
出版社：London : Murray, 1996.
| |
0
索取号：O6/E998-2
作者：
出版社：London : Murray, 1994.
|
|
0
索取号：O6/E999.5
作者：Chang、 Raymond.、
出版社：New York : McGraw-Hill, c1994.
| |
0
索取号：TN1-53/E906
作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、
出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
|
|
0
索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
| |
0
索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
|
|
0
索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
| |
0
索取号：O6-62/E992
作者：Kimble、 Margaret G.、
出版社：Dubuque, Iowa : Wm. C. Brown Pulishers, c1994.
|
|
0
索取号：TN24-7/E801/1979
作者：IEEE/OSA Conference on Laser Engineering and Applications (1979 : Washington、 D.C.)、IEEE Quantum Electronics and Applications Society.、Optical Society of America.、
出版社：New York : Institute of Electrical and Electronics Engineers, c1979.
| |
0
索取号：TN1-53/E805
作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、
出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
|
|
0
索取号：TN019.2-7/E801/1975
作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、
出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
| |
0
索取号：TN019.2/E806/1972
作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、
出版社：New York : Institute of Electrical and Electronics Engineers, 1972.
|
|
0
索取号：TN-7/E801/1977
作者：International Electrical、 Electronics Conference and Exposition (1977 : Toronto、 Ont.)、Institute of Electrical and Electronics Engineers. Canadian Region.、
出版社：[s.l : IEEE, 1977]
| |
0
索取号：F632.765.8/E20031
作者：Mueller、 Milton、
出版社：Hong Kong : The Chinese University of Hong Kong Presse, 1991
|
粤公网安备 44030602003680号