大拱桥--暨南大学学生门户 » 图书馆 » 半导体物理学 » The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
名称 The physics of SiO₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
索引号 O47-53/E803
分类号 O47-53
O47(半导体物理学)
O4(物理学)
O(数理科学和化学)
作者 International Topical Conference on the Physics of SiO₂ and Its Interfaces (1978 : Yorktown Heights、 N.Y.)、Pantelides、 Sokrates T.、
出版社 New York : Pergamon Press, c1978.
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页数 xi, 488 p. : ill. ; 27 cm.
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