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Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, Caribe Royale Resort Suites, May 12-15, 2002, Orlando, Florida.

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索取号:TN4-53/E901/2002
作者:Custom Integrated Circuits Conference (2002 : Orlando、 Florida.)、IEEE Solid-State Circuits Society.、the Electron Devices Society.、
出版社:Piscataway : IEEE, c2002.

IEEE Radio Frequency Integrated Circuits (RFIC) Symposium : Digest of papers

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索取号:TN454-532/E20031/2002
作者:IEEE Radio Frequency Integrated Circuits Symposium (2002).、Schellenberg、 James M.、IEEE Microwave Theory and Techniques Society.、IEEE Electron Devices Society.、
出版社:[New York, N.Y.] : IEEE, c2002.

Radiological safety aspects of the operation of electron linear accelerators

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索取号:R14/E801
作者:Swanson、 William P.、International Atomic Energy Agency.、
出版社:Vienna : International Atomic Energy Agency, 1979.

IEEE conference record of 1984 Sixteenth Power Modulator Symposium

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索取号:TN78-53/E901/16
作者:Power Modulator Symposium (16th : 1984 : Arlington、 Va.)、IEEE Electron Devices Society.、United States. Advisory Group on Electron Devices.、Palisades Institute for Research Services.、
出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers, c1984.

IEEE conference record of 1978 thirteenth Pulse Power Modulator Symposium : papers presented at the Statler Hilton-Buffalo, New York, June 20-22, 1978

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索取号:TN78-53/E901/13
作者:Pulse Power Modulator Symposium (13th : 1978 : Buffalo)、IEEE Electron Devices Society、United States. Advisory Group on Electron Devices、State University of New York at Buffalo、
出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : available form IEEE Single Copy Sales, c1978

Electron microscopy of thin crystals

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索取号:TN27/E801
作者:Hirsch、 P. B. (Peter Bernhard)、
出版社:London Buterworth Huntington, N.Y. : R. E. Krieger Pub. Co., 1965,c1977.

Electron energy loss spectroscopy and surface vibrations

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索取号:TN01/E901
作者:Ibach、 H.、 1941-、Mills、 D. L.、
出版社:New York : Academic Press, 1982.

Advanced scanning electron microscopy and X-ray microanalysis

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索取号:TN153/E901
作者:
出版社:New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

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索取号:TN153/E802
作者:Fryer、 J. R.、
出版社:London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

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索取号:TN153/E801
作者:
出版社:London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号:TN153-53/E804/1974
作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社:Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号:TN153-53/E801/10.3
作者:International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社:West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Electron microscopy 1978 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号:TN153-53/E801/9.3
作者:International Congress on Electron Microscopy (9th : 1978 : Toronto、 Ont.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社:Toronto : Microscopical Society of Canada, c1978.

Electron microscopy 1978 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号:TN153-53/E801/9.1
作者:International Congress on Electron Microscopy (9th : 1978 : Toronto、 Ont.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社:Toronto : Microscopical Society of Canada, c1978.

Electron microscopy 1974 : abstracts of papers presented to the Eighth International Congress on Electron Microscopy, held in Canberra, Australia, August 25-31, 1974

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索取号:TN153-53/E801/8.2
作者:International Congress on Electron Microscopy (8th : 1974 : Canberra、 A.C.T.)、Sanders、 J. V.、Goodchild、 D. J.、
出版社:Canberra : Australian Academy of Science, [1974?]

Tabulation of published data on electron devices of the U.S.S.R. through December 1973

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索取号:TN11-62/E801
作者:Marsden、 Charles P.、
出版社:Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1974.
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