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	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974 0 索取号：TN141-53/E801/1974 作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.		Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.
	Polarons in ionic crystals and polar semiconductors : Antwerp Advanced Study Institute 1971 on Fr?hlich polarons and electron-phonon interaction in polar semiconductors 0 索取号：TN304.6/E801 作者：Antwerp Advanced Study Institute on Fr?hlich Polarons and Electron-Phonon Interaction in Polar Semiconductors (1971)、Devreese、 J. T. (Jozef T.)、出版社：Amsterdam : North-Holland Publishing Company ; New York : American Elsevier Publishing Co., 1972.		Technical digest : 1977 International Electron Devices Meeting, December 5, 6 and 7, 1977, Washington, D.C. 0 索取号：TN11-53/E801/1977 作者：International Electron Devices Meeting (23rd : 1977 : Washington、 D.C.)、IEEE Electron Devices Society.、出版社：New York : Institute of Electrical and Electronics Engineers, 1977.
	Electron and ion beam science and technology : proceedings 0 索取号：TF134-53/E701 作者：International Conference on Electron and Ion Beam Science and Technology (2nd : 1966 : New York)、Bakish、 Robert A.、Metallurgical Society of AIME. Institute of Metals Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：New York : American Institute of Mining, Metallurgical, and Petroleum Engineers, [c1969]		Electron fractography handbook 0 索取号：TG113/E801 作者：出版社：Columbus, Ohio : Metals and Ceramics Information Center, Battelle Columbus Laboratories, 1976.
	Microscopy, immunohistochemistry, and antigen retrieval methods : for light and electron microscopy 0 索取号：R392.11/E20031 作者：Hayat、 M. A.、 1936-、出版社：New York : Kluwer Academic/Plenum Publishers, c2002.		Proceedings : IEEE Lester Eastman Conference on High Performance Devices : August 6,7, and 8, 2002, University of Delaware, Newark, Delaware 0 索取号：TN3-532/E20041/2002 作者：IEEE Lester Eastman Conference on High Performance Devices (2002 : Newark、 Del.)、Lunardi、 Leda.、Zolper、 J. C.、Leoni、 Robert E.、 1970-、University of Delaware.、IEEE Electron Devices Society.、Institute of Electrical and Electronics Engineers.、出版社：[Piscataway, N.J.?] : Institute of Electrical and Electronics Engineers, c2002.

	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974 0 索取号：TN141-53/E801/1974 作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.		Proceedings : thirty-first annual meeting electron microscopy society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973 0 索取号：TN153-53/E802/31 作者：Electron Microscopy Society of America.、Arceneaux、 Claude J.、Meeting Electron Microscopy Society of America.、出版社：Baton Rouge : Claitor's Publishing Division, 1973.
	Polarons in ionic crystals and polar semiconductors : Antwerp Advanced Study Institute 1971 on Fr?hlich polarons and electron-phonon interaction in polar semiconductors 0 索取号：TN304.6/E801 作者：Antwerp Advanced Study Institute on Fr?hlich Polarons and Electron-Phonon Interaction in Polar Semiconductors (1971)、Devreese、 J. T. (Jozef T.)、出版社：Amsterdam : North-Holland Publishing Company ; New York : American Elsevier Publishing Co., 1972.		Technical digest : 1977 International Electron Devices Meeting, December 5, 6 and 7, 1977, Washington, D.C. 0 索取号：TN11-53/E801/1977 作者：International Electron Devices Meeting (23rd : 1977 : Washington、 D.C.)、IEEE Electron Devices Society.、出版社：New York : Institute of Electrical and Electronics Engineers, 1977.
	Electron and ion beam science and technology : proceedings 0 索取号：TF134-53/E701 作者：International Conference on Electron and Ion Beam Science and Technology (2nd : 1966 : New York)、Bakish、 Robert A.、Metallurgical Society of AIME. Institute of Metals Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：New York : American Institute of Mining, Metallurgical, and Petroleum Engineers, [c1969]		Electron fractography handbook 0 索取号：TG113/E801 作者：出版社：Columbus, Ohio : Metals and Ceramics Information Center, Battelle Columbus Laboratories, 1976.
	Microscopy, immunohistochemistry, and antigen retrieval methods : for light and electron microscopy 0 索取号：R392.11/E20031 作者：Hayat、 M. A.、 1936-、出版社：New York : Kluwer Academic/Plenum Publishers, c2002.		Proceedings : IEEE Lester Eastman Conference on High Performance Devices : August 6,7, and 8, 2002, University of Delaware, Newark, Delaware 0 索取号：TN3-532/E20041/2002 作者：IEEE Lester Eastman Conference on High Performance Devices (2002 : Newark、 Del.)、Lunardi、 Leda.、Zolper、 J. C.、Leoni、 Robert E.、 1970-、University of Delaware.、IEEE Electron Devices Society.、Institute of Electrical and Electronics Engineers.、出版社：[Piscataway, N.J.?] : Institute of Electrical and Electronics Engineers, c2002.