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Proceedings

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索取号:TN3-53/E801/2
作者:International Conference on the Physics and Chemistry of Semiconductor Heterojunctions and Layer Structures、 Budapest、 1970.、Szigeti、 G. (GÿОrgy)、 1905- ed.、International Union of Pure and Applied Physics.、European Physical Society.、Magyar TudoḿАnyos Akad́Еmia. M̋Уszaki TudoḿАnyok Oszt́Аlya.、ËОtv̈Оs LoŕАnd Fizikai T́Аrsulat.、H́Иrad́Аstechnikai TudoḿАnyos Egyes̈Уlet.、
出版社:Budapest, Akad́Еmiai Kiad́О, 1971.

Proceedings

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索取号:TN3-53/E801/1
作者:International Conference on the Physics and Chemistry of Semiconductor Heterojunctions and Layer Structures、 Budapest、 1970.、Szigeti、 G. (GÿОrgy)、 1905- ed.、International Union of Pure and Applied Physics.、European Physical Society.、Magyar TudoḿАnyos Akad́Еmia. M̋Уszaki TudoḿАnyok Oszt́Аlya.、ËОtv̈Оs LoŕАnd Fizikai T́Аrsulat.、H́Иrad́Аstechnikai TudoḿАnyos Egyes̈Уlet.、
出版社:Budapest, Akad́Еmiai Kiad́О, 1971.

Gasdynamic and chemical lasers : proceedings of the international symposium, 11-15 October 1976, K̈Оln

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索取号:TN248-53/E801/1976
作者:
出版社:K̈Оln-Porz, Germany : DFVLR-Press, 1976,c[1977?]

Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971

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索取号:TN24-53/E804
作者:
出版社:New York, Wiley [1973]

Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California

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索取号:TN24-53/E904
作者:
出版社:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.

14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy

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索取号:TP301-53/E991/14
作者:Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、
出版社:Los Alamitos, Calif : IEEE Computer Society Press, c1999.

Power algebras over semirings : with applications in mathematics and computer science

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索取号:O153.3/E991
作者:Golan、 Jonathan S.、
出版社:Dordrecht ; Boston : Kluwer Academic Publishers, c1999.

Basic mathematics for electronics

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索取号:TN01/E904.5
作者:Cooke、 Nelson Magor.、Adams、 Herbert F. R.、Dell、 Peter B.、
出版社:New York : Gregg Division, McGraw-Hill, 1982.

Mathematics for Basic electronics

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索取号:TN01/E903.2
作者:Grob、 Bernard.、Grob、 Bernard. Basic electronics.、Grob、 Bernard. Mathematics.、
出版社:New York : McGraw-Hill, 1986.

Submillimeter wave : proceedings of the symposium

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索取号:TN018-53/E802
作者:Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、
出版社:Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971

Digest : 1979 IEEE MTT-S International Microwave Symposium

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索取号:TN019.2-7/E801/1979
作者:IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、
出版社:New York : Institute of Electrical and Electronics Engineers, c1979

Rational fault analysis

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索取号:TN106/E802
作者:Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社:New York : M. Dekker, 1977.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号:TN153-53/E804/1974
作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社:Chicago Ill. : IIT Research Institute, 1973.

Semiconductor devices for power conditioning

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索取号:TN303-53/E901/1981
作者:Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、
出版社:New York : Plenum Press, 1982.

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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索取号:TN304-53/E901/1985
作者:International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、
出版社:Amsterdam ; New York : Elsevier, 1985.

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.

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索取号:TN304-53/E903/2
作者:
出版社:New York : North-Holland, 1983.
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