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0 索取号:TP393.0/E20031.2 作者:Stallings、 William.、 出版社:北京 : China Machine Press, 2002.
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0 索取号:R199.712/E20031.r 作者: 出版社:New York : John Wiley & Sons, 1997.
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0 索取号:X-651/E20031.2 作者:Erbes、 Russell E.、 出版社:New York : John Wiley & Sons, c1996.
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0 索取号:F127.659/E20031/1992 作者: 出版社:Macau : Centre of Macau Studies, University of Macau : Instituto Cultural de Macau, [1992].
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0 索取号:C931.6/E20032 作者:Kinney、 William R.、 出版社:Boston : Irwin/McGraw-Hill, 2000.
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0 索取号:TS205/E20046 作者:Leistner、 Lothar.、Gould、 G. W. (Grahame Warwick)、 出版社:New York : Kluwer Academic/Plenum Publishers, c2002.
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0 索取号:R371/E8046 作者: 出版社:Atlanta, Ga. : U.S. Dept. of Health, Education, and Welfare, Public Health Service, Center for Disease Control, Bureau of Laboratories, 1979.
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0 索取号:TS27/E20041 作者: 出版社:Boca Raton : CRC Press, c2003.
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0 索取号:R-013/E801 作者:California. Board of Medical Quality Assurance.、 出版社:Sacramento : The Board, 1978.
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0 索取号:TS255/E20041 作者: 出版社:Boca Raton, Fla. : CRC Press ; Cambridge, England : Woodhead Publishing, 2002.
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0 索取号:C93/E20064.7 作者:Certo、 Samuel C.、 出版社:Beijing : Tsinghua University Press 1998.
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0 索取号:R197/E902 作者:Bennett、 Addison C.、Tibbitts、 Samuel J.、 出版社:Rockville, Md. : Aspen Publishers, 1989.
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0 索取号:F406.3/E994.3 作者:Dale、 B. G.、 出版社:Oxford ; Malden, Mass. : Blackwell Business, 1999.
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0 索取号:TH74-55/E901/60 作者: 出版社:OPIE USA Palos Verdes Estates, Calif. : Society of Photo-optical Instrumentation Engineers, 1975.
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0 索取号:TM93-53/E901/1982 作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、 出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.
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0 索取号:TH74-55/E901/220 作者: 出版社:Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1980.
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