搜索包含 Mathematics Research Center (United States. Army) 的图书 - 暨南大学图书馆

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	Animals for research : principles of breeding and management 0 索取号：Q95-331/E702 作者：出版社：London : Academic Press, 1963.		IEEE conference record of 1984 Sixteenth Power Modulator Symposium 0 索取号：TN78-53/E901/16 作者：Power Modulator Symposium (16th : 1984 : Arlington、 Va.)、IEEE Electron Devices Society.、United States. Advisory Group on Electron Devices.、Palisades Institute for Research Services.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1984.
	IEEE conference record of 1978 thirteenth Pulse Power Modulator Symposium : papers presented at the Statler Hilton-Buffalo, New York, June 20-22, 1978 0 索取号：TN78-53/E901/13 作者：Pulse Power Modulator Symposium (13th : 1978 : Buffalo)、IEEE Electron Devices Society、United States. Advisory Group on Electron Devices、State University of New York at Buffalo、出版社：New York : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : available form IEEE Single Copy Sales, c1978		Business research methods 0 索取号：F710/E994.5 作者：Cooper、 Donald R.、Emory、 William.、Emory、 William. Business research methods.、出版社：Chicago : Irwin, c1995.
	Advanced research in VLSI : proceedings of the sixth MIT conference 0 索取号：TN47-53/E991/6 作者：出版社：Cambridge, Mass. : MIT Press, 1990.		Semiconductor and integrated circuit fabrication techniques 0 索取号：TN43/E801 作者：Gise、 Peter E.、Blanchard、 Richard、 joint author.、Fairchild Management and Career Development Center.、Fairchild Camera and Instrument Co.、出版社：Reston, Va. : Reston Pub. Co., 1979.
	Proceedings of the Symposium on Optical and Acoustical Micro-Electronics, New York, N.Y., April 16-18, 1974 0 索取号：TN4-53/E802/1974 作者：Symposium on Optical and Acoustical Micro-Electronics、 New York、 1974.、Fox、 Jerome.、Schlam、 Mark Howard.、Polytechnic Institute of New York. Microwave Research Institute.、出版社：Brooklyn, N.Y. : Polytechnic Press : distributors, Halsted Press, 1975.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 0 索取号：TN27-53/E806/1976 作者：Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、出版社：[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.		Research methods in psychology 0 索取号：B841/E992.4 作者：Shaughnessy、 John J.、 1947-、Zechmeister、 Eugene B.、 1944-、出版社：New York : McGraw-Hill, c1997.
	Power algebras over semirings : with applications in mathematics and computer science 0 索取号：O153.3/E991 作者：Golan、 Jonathan S.、出版社：Dordrecht ; Boston : Kluwer Academic Publishers, c1999.		Basic mathematics for electronics 0 索取号：TN01/E904.5 作者：Cooke、 Nelson Magor.、Adams、 Herbert F. R.、Dell、 Peter B.、出版社：New York : Gregg Division, McGraw-Hill, 1982.
	Mathematics for Basic electronics 0 索取号：TN01/E903.2 作者：Grob、 Bernard.、Grob、 Bernard. Basic electronics.、Grob、 Bernard. Mathematics.、出版社：New York : McGraw-Hill, 1986.		Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.

	Animals for research : principles of breeding and management 0 索取号：Q95-331/E702 作者：出版社：London : Academic Press, 1963.		IEEE conference record of 1984 Sixteenth Power Modulator Symposium 0 索取号：TN78-53/E901/16 作者：Power Modulator Symposium (16th : 1984 : Arlington、 Va.)、IEEE Electron Devices Society.、United States. Advisory Group on Electron Devices.、Palisades Institute for Research Services.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1984.
	IEEE conference record of 1978 thirteenth Pulse Power Modulator Symposium : papers presented at the Statler Hilton-Buffalo, New York, June 20-22, 1978 0 索取号：TN78-53/E901/13 作者：Pulse Power Modulator Symposium (13th : 1978 : Buffalo)、IEEE Electron Devices Society、United States. Advisory Group on Electron Devices、State University of New York at Buffalo、出版社：New York : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : available form IEEE Single Copy Sales, c1978		Business research methods 0 索取号：F710/E994.5 作者：Cooper、 Donald R.、Emory、 William.、Emory、 William. Business research methods.、出版社：Chicago : Irwin, c1995.
	Advanced research in VLSI : proceedings of the sixth MIT conference 0 索取号：TN47-53/E991/6 作者：出版社：Cambridge, Mass. : MIT Press, 1990.		Semiconductor and integrated circuit fabrication techniques 0 索取号：TN43/E801 作者：Gise、 Peter E.、Blanchard、 Richard、 joint author.、Fairchild Management and Career Development Center.、Fairchild Camera and Instrument Co.、出版社：Reston, Va. : Reston Pub. Co., 1979.
	Proceedings of the Symposium on Optical and Acoustical Micro-Electronics, New York, N.Y., April 16-18, 1974 0 索取号：TN4-53/E802/1974 作者：Symposium on Optical and Acoustical Micro-Electronics、 New York、 1974.、Fox、 Jerome.、Schlam、 Mark Howard.、Polytechnic Institute of New York. Microwave Research Institute.、出版社：Brooklyn, N.Y. : Polytechnic Press : distributors, Halsted Press, 1975.		Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California 0 索取号：TN27-53/E803 作者：Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、出版社：[Palos Verdes Estates, Calif.] : SPIE, 1976.
	Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 0 索取号：TN27-53/E806/1976 作者：Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、出版社：[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.		Research methods in psychology 0 索取号：B841/E992.4 作者：Shaughnessy、 John J.、 1947-、Zechmeister、 Eugene B.、 1944-、出版社：New York : McGraw-Hill, c1997.
	Power algebras over semirings : with applications in mathematics and computer science 0 索取号：O153.3/E991 作者：Golan、 Jonathan S.、出版社：Dordrecht ; Boston : Kluwer Academic Publishers, c1999.		Basic mathematics for electronics 0 索取号：TN01/E904.5 作者：Cooke、 Nelson Magor.、Adams、 Herbert F. R.、Dell、 Peter B.、出版社：New York : Gregg Division, McGraw-Hill, 1982.
	Mathematics for Basic electronics 0 索取号：TN01/E903.2 作者：Grob、 Bernard.、Grob、 Bernard. Basic electronics.、Grob、 Bernard. Mathematics.、出版社：New York : McGraw-Hill, 1986.		Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.