大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 NATO Advanced Research Workshop on Numerical Integration: Recent Developments 的图书(共6955本)

Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976

0
索取号:TN27-53/E806/1976
作者:Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、
出版社:[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.

Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif

0
索取号:TN27-53/E904/1980
作者:Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、
出版社:New York IEEE Los Alamitos, CA : The Society, c1980.

Time-varying image processing and moving object recognition : proceedings of the international workshop, Florence, Italy, September 8-9, 1986

0
索取号:TN27-53/E902
作者:
出版社:Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1987.

Advanced theory of semiconductor devices

0
索取号:TN303/E902
作者:Hess、 Karl、 1945-、
出版社:Englewood Cliffs, N.J. : Prentice-Hall, 1988.

Research methods in psychology

0
索取号:B841/E992.4
作者:Shaughnessy、 John J.、 1947-、Zechmeister、 Eugene B.、 1944-、
出版社:New York : McGraw-Hill, c1997.

Advanced materials Science : 21st century

0
索取号:TB3/E20011
作者:
出版社:Cambridge Cambridge International Science Pub. 2000

Computer science logic : 13th international workshop, CSL '99 : 8th annual conference of the EACSL, Madrid, Spain, September 20-25, 1999 : proceedings

0
索取号:TP302.2-532/E20011/1999
作者:Workshop on Computer Science Logic (13th : 1999 : Madrid、 Spain)、Flum、 Jörg.、Rodríguez Artalejo、 M. (Mario)、European Association for Computer Science Logic. Conference (8th : 1999 : Madrid、 Spain)、
出版社:Berlin ; New York : Springer, c1999.

Recent advances in parallel virtual machine and message passing interface : 6th European PVM/MPI User's Group Meeting, Barcelona, Spain, September 26-29, 1999 : proceedings

0
索取号:TP338.6-532/E991/6
作者:European PVM/MPI User's Group Meeting (6th : 1999 : Barcelona、 Spain)、Dongarra、 J. J.、Luque、 E.、Margalef、 Tom as.、
出版社:New York : Springer-Verlag, 2000.

Intelligent agents for telecommunicationapplications : Third International Workshop, IATA'99, Stockholm, Sweden, August 1999: proceedings

0
索取号:TN91-532/E20011
作者:International Workshop on Intelligent Agents for Telecommunication Applications (3rd : 1999 : Stockholm、 Sweden)、Albayrak、 Sahin.、
出版社:New York : Springer, 1999.

Advanced topics in just-in-time management

0
索取号:F270.7/E992
作者:Schniederjans、 Marc J.、Olson、 John R.、 1938-、
出版社:Westport, Conn. : Quorum Books, 1999.

ELF-VLF radio wave propagation : proceedings of the NATO Advanced Study Institute held at Sp̊Аtind, Norway, April 17-27, 1974

0
索取号:TN018-53/E801
作者:NATO Advanced Study Institute (1974 : Sp̊Аtind、 Norway)、Holtet、 J. A. (Jan A.)、 1939-、
出版社:Dordrecht ; Boston : D. Reidel Pub. Co., 1974.

Submillimeter wave : proceedings of the symposium

0
索取号:TN018-53/E802
作者:Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、
出版社:Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971

Advanced industrial electronics

0
索取号:TN1/E903.2
作者:Morris、 Noel Malcolm.、
出版社:London ; New York : McGraw-Hill, 1984

Rational fault analysis

0
索取号:TN106/E802
作者:Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社:New York : M. Dekker, 1977.

Advanced scanning electron microscopy and X-ray microanalysis

0
索取号:TN153/E901
作者:
出版社:New York : Plenum Press, 1986.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

0
索取号:TN153-53/E804/1974
作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社:Chicago Ill. : IIT Research Institute, 1973.
最近添加的分类