搜索包含 Cleveland Symposium on Macromolecules (3rd : 1981) 的图书 - 暨南大学图书馆

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	Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]		Emerging optical materials : [proceedings] : August 25-26, 1981, San Diego, California 0 索取号：TN24-53/E901 作者：出版社：Bellingham, Wash. : SPIE--The International Society for Optical Engineering, 1982.
	Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.		14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.
	Computers in cardiology 1998 : September 13-16, 1998, Cleveland, Ohio, USA 0 索取号：R319-532/E991/1998 作者：出版社：Piscataway, New Jersey : IEEE, c1998.		Intelligent agents for telecommunicationapplications : Third International Workshop, IATA'99, Stockholm, Sweden, August 1999: proceedings 0 索取号：TN91-532/E20011 作者：International Workshop on Intelligent Agents for Telecommunication Applications (3rd : 1999 : Stockholm、 Sweden)、Albayrak、 Sahin.、出版社：New York : Springer, 1999.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.
	Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 0 索取号：TN304-53/E902/1981 作者：出版社：Bristol : Institute of Physics, c1981.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.
	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. 0 索取号：TN304-53/E903/2 作者：出版社：New York : North-Holland, 1983.		Insulating films on semiconductors : proceedings of the second international conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27-29, 1981 0 索取号：TN304.055-53/E901/1981 作者：INFOS 81 (1981 : Erlangen、 Germany)、Schulz、 M. (Max)、Pensl、 G. (Gerhard)、出版社：Berlin ; New York : Springer-Verlag, 1981.

	Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]		Emerging optical materials : [proceedings] : August 25-26, 1981, San Diego, California 0 索取号：TN24-53/E901 作者：出版社：Bellingham, Wash. : SPIE--The International Society for Optical Engineering, 1982.
	Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.		14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.
	Computers in cardiology 1998 : September 13-16, 1998, Cleveland, Ohio, USA 0 索取号：R319-532/E991/1998 作者：出版社：Piscataway, New Jersey : IEEE, c1998.		Intelligent agents for telecommunicationapplications : Third International Workshop, IATA'99, Stockholm, Sweden, August 1999: proceedings 0 索取号：TN91-532/E20011 作者：International Workshop on Intelligent Agents for Telecommunication Applications (3rd : 1999 : Stockholm、 Sweden)、Albayrak、 Sahin.、出版社：New York : Springer, 1999.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		NASECODE III : proceedings of the third International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, held in Galway, Ireland from 15th to 17th June, 1983 0 索取号：TN303-53/E902/3 作者：NASECODE Conference (3rd : 1983 : Galway、 Ireland)、Miller、 John J. H.、Commission of the European Communities.、出版社：Dublin : Boole Press, 1983.
	Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 0 索取号：TN304-53/E902/1981 作者：出版社：Bristol : Institute of Physics, c1981.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.
	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. 0 索取号：TN304-53/E903/2 作者：出版社：New York : North-Holland, 1983.		Insulating films on semiconductors : proceedings of the second international conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27-29, 1981 0 索取号：TN304.055-53/E901/1981 作者：INFOS 81 (1981 : Erlangen、 Germany)、Schulz、 M. (Max)、Pensl、 G. (Gerhard)、出版社：Berlin ; New York : Springer-Verlag, 1981.