搜索包含 Testing 的图书 - 暨南大学图书馆

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	Patch testing and prick testing : a practical guide 0 索取号：R758.2/E20041 作者：Lachapelle、 Jean-Marie、 1937-、Maibach、 Howard I.、Ring、 J.、Fregert、 Siegfried. Manual of contact dermatitis.、出版社：Berlin ; Hong Kong : Springer, 2003.		Identifying relevant information for testing technique selection : an instantiatedcharacterization schema 0 索取号：TP31/E20041 作者：Vegas、 Sira.、Juristo、 Natalia.、Basili、 Victor R.、 1940-、出版社：Boston : London : Kluwer Academic, c2003.
	Proceedings of the 2002 International Symosium on Software Testing and Analysis(ISSTA) : July 22-24, 2002, Roma, Italy 0 索取号：TP31-532/E20042/2002 作者：International Symposium on Software Testing and Analysis (Held 22-24 July 2002、: Rome、 Italy.)、Frankl、 Phyllis G.、Zeil、 Steven Joseph、 1957-、Association for Computing Machinery.、出版社：New York, N. Y. : ACM Press, c2002.		Digest of papers : testing to integrate semiconductor memories into computer mainframes 0 索取号：TP333.15/E802 作者：Semiconductor Memory Test Symposium (1972 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、Institute for Electrical and Electronics Engineers. Philadelphia Chapter.、出版社：New York : Institute of Electrical and Electronics Engineers, c1973.
	Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1977 作者：Symposium on Semiconductor Memory Testing (1977 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、IEEE Computer Society. Philadelphia Chapter.、出版社：New York : Institute of Electrical and Electronics Engineers, c1977.		Automated testing for electronics manufacturing : ATE Seminar/Exhibit, January 30-February 1, 1978, L. A. Marriott, Los Angeles, CA : proceedings 0 索取号：TP216-53/E801/1978 作者：ATE Seminar、 2d、 Los Angeles、 1978.、Circuits manufacturing.、出版社：[s.l.] : Benwill Pub. Corp., c1978.
	Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA. : proceedings, ATE Seminar and exhibit 0 索取号：TP216-53/E801/1977 作者：ATE Seminar、 Cambridge、 Mass.、 1977.、出版社：[s.l.] : Benwill Pub. Corp., c1977.		More psychometric testing : 1000 new ways to assess your personality, creativity, intelligence and lateral thinking 0 索取号：B841.7/E20041 作者：Carter、 Philip J.、出版社：Chichester, West Sussex, England ; Hoboken, NJ : Wiley, 2003.
	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		Experiments in materials technology : a laboratory text for engineers in physical metallurgy, manufacturing process metallurgy and materials testing 0 索取号：TB302/E803 作者：出版社：New Delhi : Affiliated East-West Press, 1973.
	Safety testing of new drugs : laboratory predictions and clinical performance 0 索取号：R965/E901 作者：出版社：London ; Orlando : Academic Press , 1984.		Dictionary of language testing = 语言测试词典 0 索取号：H09-61/E20031 作者：出版社：北京 : 外语敎学与硏究出版社, 2002.
	Microbiological testing in food safety management 0 索取号：TS201.3/E20033 作者：International Commission on Microbiological Specifications for Foods.、Tompkin、 R. B. (R. Bruce)、出版社：New York, N.Y. : Kluwer Academic/PlenumPublishers, c2002.		Sensory testing methods 0 索取号：R339.4/E991.2 作者：出版社：West Conshohocken, PA : ASTM, c1996.
	Industrial deafness; hearing testing and noise measurement 0 索取号：R135.8/E601 作者：Sataloff、 Joseph.、出版社：New York : Blakiston Division, 1957.		Manual for hepatitis B antigen testing 0 索取号：R512.6/E804 作者：Ashcavai、 Mary.、Peters、 Robert L.、 1927-、出版社：London; Philadelphia, Saunders, 1973.

	Patch testing and prick testing : a practical guide 0 索取号：R758.2/E20041 作者：Lachapelle、 Jean-Marie、 1937-、Maibach、 Howard I.、Ring、 J.、Fregert、 Siegfried. Manual of contact dermatitis.、出版社：Berlin ; Hong Kong : Springer, 2003.		Identifying relevant information for testing technique selection : an instantiatedcharacterization schema 0 索取号：TP31/E20041 作者：Vegas、 Sira.、Juristo、 Natalia.、Basili、 Victor R.、 1940-、出版社：Boston : London : Kluwer Academic, c2003.
	Proceedings of the 2002 International Symosium on Software Testing and Analysis(ISSTA) : July 22-24, 2002, Roma, Italy 0 索取号：TP31-532/E20042/2002 作者：International Symposium on Software Testing and Analysis (Held 22-24 July 2002、: Rome、 Italy.)、Frankl、 Phyllis G.、Zeil、 Steven Joseph、 1957-、Association for Computing Machinery.、出版社：New York, N. Y. : ACM Press, c2002.		Digest of papers : testing to integrate semiconductor memories into computer mainframes 0 索取号：TP333.15/E802 作者：Semiconductor Memory Test Symposium (1972 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、Institute for Electrical and Electronics Engineers. Philadelphia Chapter.、出版社：New York : Institute of Electrical and Electronics Engineers, c1973.
	Digest of papers : 1977 Semictonductor Test Symposium, Memory and LSI. Oct. 25-27, 1977, held at Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1977 作者：Symposium on Semiconductor Memory Testing (1977 : Cherry Hill、 N.J.)、IEEE Computer Society. Mideastern Area Committee.、IEEE Computer Society. Philadelphia Chapter.、出版社：New York : Institute of Electrical and Electronics Engineers, c1977.		Automated testing for electronics manufacturing : ATE Seminar/Exhibit, January 30-February 1, 1978, L. A. Marriott, Los Angeles, CA : proceedings 0 索取号：TP216-53/E801/1978 作者：ATE Seminar、 2d、 Los Angeles、 1978.、Circuits manufacturing.、出版社：[s.l.] : Benwill Pub. Corp., c1978.
	Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA. : proceedings, ATE Seminar and exhibit 0 索取号：TP216-53/E801/1977 作者：ATE Seminar、 Cambridge、 Mass.、 1977.、出版社：[s.l.] : Benwill Pub. Corp., c1977.		More psychometric testing : 1000 new ways to assess your personality, creativity, intelligence and lateral thinking 0 索取号：B841.7/E20041 作者：Carter、 Philip J.、出版社：Chichester, West Sussex, England ; Hoboken, NJ : Wiley, 2003.
	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		Experiments in materials technology : a laboratory text for engineers in physical metallurgy, manufacturing process metallurgy and materials testing 0 索取号：TB302/E803 作者：出版社：New Delhi : Affiliated East-West Press, 1973.
	Safety testing of new drugs : laboratory predictions and clinical performance 0 索取号：R965/E901 作者：出版社：London ; Orlando : Academic Press , 1984.		Dictionary of language testing = 语言测试词典 0 索取号：H09-61/E20031 作者：出版社：北京 : 外语敎学与硏究出版社, 2002.
	Microbiological testing in food safety management 0 索取号：TS201.3/E20033 作者：International Commission on Microbiological Specifications for Foods.、Tompkin、 R. B. (R. Bruce)、出版社：New York, N.Y. : Kluwer Academic/PlenumPublishers, c2002.		Sensory testing methods 0 索取号：R339.4/E991.2 作者：出版社：West Conshohocken, PA : ASTM, c1996.
	Industrial deafness; hearing testing and noise measurement 0 索取号：R135.8/E601 作者：Sataloff、 Joseph.、出版社：New York : Blakiston Division, 1957.		Manual for hepatitis B antigen testing 0 索取号：R512.6/E804 作者：Ashcavai、 Mary.、Peters、 Robert L.、 1927-、出版社：London; Philadelphia, Saunders, 1973.